https://publica.fraunhofer.de/entities/publication/7e277cdb-0c04-45a8-904f-0cb1cfd9000f
https://publica.fraunhofer.de/entities/publication/821501cb-e565-4057-b045-55e1b477a79c
https://publica.fraunhofer.de/entities/publication/8c703657-c070-4106-a58e-bc8102752ab3
https://publica.fraunhofer.de/entities/publication/8ad66680-5d01-47d1-8a18-00c30438c643
https://publica.fraunhofer.de/entities/publication/8c531ae4-764c-421e-84c2-1432cedf547b
https://publica.fraunhofer.de/entities/publication/8c654e18-045e-438b-a995-0e4756f3fbfc
https://publica.fraunhofer.de/entities/publication/7ad87028-64e9-42e5-a031-5a0d8b288ce9
https://publica.fraunhofer.de/entities/publication/8c5c17f1-cb60-4178-b020-9ab9999e69fe
https://publica.fraunhofer.de/entities/publication/7cf9d9d1-edb4-43a3-bf1a-2af0b0f96212
https://publica.fraunhofer.de/entities/publication/8ad7246a-f557-49b7-9c63-fc2855c4e77d
https://publica.fraunhofer.de/entities/publication/8b8cabc4-3e7d-4a50-a323-288268a10a99
https://publica.fraunhofer.de/entities/publication/a725d3d8-9359-4224-9008-c297a5ffa062
https://publica.fraunhofer.de/entities/publication/aa23abe7-da07-4a14-bd86-c672ec4c1ff8
https://publica.fraunhofer.de/entities/publication/82849dc5-98c1-41a1-8803-0142c299f328
https://publica.fraunhofer.de/entities/publication/a7f4217f-a53c-42a6-9305-69002fa3e7eb
https://publica.fraunhofer.de/entities/publication/829c5e84-f58b-40da-b831-e256efe0bc27
https://publica.fraunhofer.de/entities/publication/831ccdfd-cc0b-48e8-abc7-688293a5405f
https://publica.fraunhofer.de/entities/publication/a99c7fba-3496-4a9d-ae11-1623616ec96f
https://publica.fraunhofer.de/entities/publication/aa21e6fe-1f0c-4fd7-9560-9ae67c69764f
https://publica.fraunhofer.de/entities/publication/a76a9219-93d7-40f1-9a86-d364ec27f165
https://publica.fraunhofer.de/entities/publication/6882cce9-afbb-4131-8920-8bfe7e7b324c
https://publica.fraunhofer.de/entities/publication/9ed2c24c-ab2e-4a45-a9b8-a15304c22e97
https://publica.fraunhofer.de/entities/publication/a127d276-f399-4fe0-9182-49381ce24feb
https://publica.fraunhofer.de/entities/publication/66e8c5f0-5003-4c8a-936d-37d2a5bdeb9a
https://publica.fraunhofer.de/entities/publication/a0aead97-d4ae-472a-baf6-2faf69864e83
https://publica.fraunhofer.de/entities/publication/6871c8cf-cfce-4fa1-9617-16767629616d
https://publica.fraunhofer.de/entities/publication/9f10deaf-a778-467e-888c-4704d64aa143
https://publica.fraunhofer.de/entities/publication/6911d65a-2846-408a-8ef6-8fbfa6c2258e
https://publica.fraunhofer.de/entities/publication/77bb53b4-2f46-4de8-a812-434f00ffc054
https://publica.fraunhofer.de/entities/publication/77a07371-8f75-499a-89ae-ebf195cb280a
https://publica.fraunhofer.de/entities/publication/77b248c6-864d-479e-8e83-a225fb8d8775
https://publica.fraunhofer.de/entities/publication/780390eb-0929-4dd0-ba22-e1058b508e1b
https://publica.fraunhofer.de/entities/publication/76951955-bdca-4094-a873-93e0f2c33642
https://publica.fraunhofer.de/entities/publication/5d42546d-6281-4c1f-8c13-cdf998b04828
https://publica.fraunhofer.de/entities/publication/775330d3-7b87-44b9-90f3-e995b9814060
https://publica.fraunhofer.de/entities/publication/76924e05-d033-41cb-901f-ce69fccbd2f0
https://publica.fraunhofer.de/entities/publication/705981fb-1bf3-428f-a198-8e9c11a6c617
https://publica.fraunhofer.de/entities/publication/5b66bd47-f6c1-40c9-b644-7361ee68011b
https://publica.fraunhofer.de/entities/publication/5a548d18-d2d1-48ab-9024-92d76e64de0b
https://publica.fraunhofer.de/entities/publication/bfe9dda5-210c-414a-b954-be624948d407
https://publica.fraunhofer.de/entities/publication/c508d1be-51a1-4e3d-a57d-294d986ec498
https://publica.fraunhofer.de/entities/publication/5a8043f7-fe6c-4b97-ac55-dca85ef30c0e
https://publica.fraunhofer.de/entities/publication/4c62b9bf-033a-4cb2-989d-9cc5955aed00
https://publica.fraunhofer.de/entities/publication/5ad9d99c-df09-4f97-9e3a-474573cdefa9
https://publica.fraunhofer.de/entities/publication/bedc40d7-6068-456b-87d6-77a4df97280f
https://publica.fraunhofer.de/entities/publication/d6c265e6-6d9d-4653-85f4-b5fe7ed1dbae
https://publica.fraunhofer.de/entities/publication/d7ca7079-1019-4dab-91de-2257b42fe151
https://publica.fraunhofer.de/entities/publication/d863cf11-f5b7-4273-a290-f5884616c608
https://publica.fraunhofer.de/entities/publication/dc3b7cc4-d39e-47e5-8576-c1ef077527b0
https://publica.fraunhofer.de/entities/publication/be9c9682-c79c-4c0d-adaf-6503a877c7fd
https://publica.fraunhofer.de/entities/publication/c71c520d-a392-4578-bc1b-aa0fa7e9c4ab
https://publica.fraunhofer.de/entities/publication/ddd4d756-9d30-4289-baee-616f55e9b4db
https://publica.fraunhofer.de/entities/publication/bcf2f37a-ec83-4808-881e-13f5758c30c0
https://publica.fraunhofer.de/entities/publication/b3e36696-91ea-436e-8208-966b1ca12073
https://publica.fraunhofer.de/entities/publication/b39cfe1c-9288-499c-8906-8d56d34d852a
https://publica.fraunhofer.de/entities/publication/6b7b78b0-9f05-464c-b037-ab798a9a87d2
https://publica.fraunhofer.de/entities/publication/b2d71405-d4f3-4d87-99a7-501e473af1ad
https://publica.fraunhofer.de/entities/publication/b298b2dc-3147-48f7-a74d-2ceabe53950b
https://publica.fraunhofer.de/entities/publication/b356699a-7a83-4d62-b6ec-03cb886b5e0a
https://publica.fraunhofer.de/entities/publication/b9bcbebc-c837-4bdd-8a39-417d80e54a1a
https://publica.fraunhofer.de/entities/publication/b2d86857-587e-4cba-b9a7-f29411b1d7ed
https://publica.fraunhofer.de/entities/publication/6c49c4e2-e530-4e89-88a8-2a1502074f5a
https://publica.fraunhofer.de/entities/publication/67e4c1be-4b93-4c72-ae7f-aacc50ad8ff0
https://publica.fraunhofer.de/entities/publication/04b20154-68ad-4637-a814-7c1c6eb2203b
https://publica.fraunhofer.de/entities/publication/04b090ee-1fcc-4b74-8c16-16e779d2e0d0
https://publica.fraunhofer.de/entities/publication/04d48179-9c23-42ae-9dcd-27dcf42d8e92
https://publica.fraunhofer.de/entities/publication/04a444a4-514e-4e60-881e-86982b891892
https://publica.fraunhofer.de/entities/publication/04bcbdb6-5254-4698-9d76-f572a853eb1a
https://publica.fraunhofer.de/entities/publication/04b2bd7b-2ae7-4412-84dd-a1a7ab4ae73e
https://publica.fraunhofer.de/entities/publication/04cb34f3-f9fb-43b8-bf71-89e109f66298
https://publica.fraunhofer.de/entities/publication/0484e7b2-8e1a-4900-9720-a3231e611461
https://publica.fraunhofer.de/entities/publication/05b28bf6-273b-4527-a6e4-28c2cc096887
https://publica.fraunhofer.de/entities/publication/04d4f8f1-c8a7-47bc-abbb-74f0b52128b1
https://publica.fraunhofer.de/entities/publication/05b5fe77-c14d-4f12-a453-d1dfe862b12a
https://publica.fraunhofer.de/entities/publication/05ba0e31-24a2-41fc-a41c-be91ad93e427
https://publica.fraunhofer.de/entities/publication/04995adf-d25e-470c-888c-ab5e66dcf603
https://publica.fraunhofer.de/entities/publication/048b92a1-7c38-4e9c-9aa2-cf04583f03e7
https://publica.fraunhofer.de/entities/publication/048a5a1d-4315-403e-b1d2-c51525c081f7
https://publica.fraunhofer.de/entities/publication/05cd8280-14c2-4e73-a291-12892e3fd5d6
https://publica.fraunhofer.de/entities/publication/054fcfef-ff37-4abd-ab65-7f4287310b38
https://publica.fraunhofer.de/entities/publication/067fc6b6-3e5e-40b5-9236-143d8d3e841d
https://publica.fraunhofer.de/entities/publication/05471427-de2f-470c-87d3-621264c76de7
https://publica.fraunhofer.de/entities/publication/052aa497-de5d-4e6e-a9f5-743c8066ab19
https://publica.fraunhofer.de/entities/publication/053f5cff-8779-4113-88e2-d50804cd5cec
https://publica.fraunhofer.de/entities/publication/05631bac-8bf9-4bce-8e38-7a4cfe65a751
https://publica.fraunhofer.de/entities/publication/053f6726-9fe3-4cb7-8e64-4dd0ef1b3c1c
https://publica.fraunhofer.de/entities/publication/05319f6e-9b46-4490-ad55-38732399b972
https://publica.fraunhofer.de/entities/publication/05f08649-28cd-43e0-b998-faf913070aef
https://publica.fraunhofer.de/entities/publication/0698e565-88e8-4736-ad00-58b46be5fa8a
https://publica.fraunhofer.de/entities/publication/063af9d6-b482-4937-bafc-2c07c8283506
https://publica.fraunhofer.de/entities/publication/06ad4f91-eed2-4968-8a4b-269f65a6e4a5
https://publica.fraunhofer.de/entities/publication/06941f0a-c3ed-4395-b96f-c96b2676a5cf
https://publica.fraunhofer.de/entities/publication/069f49c8-92e9-4dd3-80f3-ee2beed01a70
https://publica.fraunhofer.de/entities/publication/068aa633-ebb9-4618-b911-96e932ae1a0a
https://publica.fraunhofer.de/entities/publication/06b42814-091b-4ac8-a889-65ee472aeab7
https://publica.fraunhofer.de/entities/publication/06481ef5-ba5e-4a8e-a617-d18459601d21
https://publica.fraunhofer.de/entities/publication/062634d7-3ca4-40a1-b43b-2cdf9de30953
https://publica.fraunhofer.de/entities/publication/062a395a-48ba-4f6f-b403-5984e342a01f
https://publica.fraunhofer.de/entities/publication/0666c657-5f94-4014-a66e-0d4792e91e5d
https://publica.fraunhofer.de/entities/publication/060ae052-0bd8-4db4-add4-924e5312f0b8
https://publica.fraunhofer.de/entities/publication/05795fc0-295d-4d97-a40d-9b3cd1b0ad5f
https://publica.fraunhofer.de/entities/publication/0622cf33-b54b-46aa-b3e3-b986f288418f
https://publica.fraunhofer.de/entities/publication/062278cf-79eb-4742-8a14-d6938542398c
https://publica.fraunhofer.de/entities/publication/0670cb40-ca12-4a26-8428-e0794a68b4f8
https://publica.fraunhofer.de/entities/publication/06103dfe-b65f-4d96-a3b4-f64d8a90d383
https://publica.fraunhofer.de/entities/publication/058662c1-113f-4df3-aedc-add4492721a0
https://publica.fraunhofer.de/entities/publication/05856020-219e-4b6b-b47a-85fe4ed9862b
https://publica.fraunhofer.de/entities/publication/058bd1c3-d4ed-46bf-99a8-1f6936002a8c
https://publica.fraunhofer.de/entities/publication/04f3051a-f828-43bd-bdc6-9fbb1ea2b673
https://publica.fraunhofer.de/entities/publication/059413b6-7ef2-40fb-96de-ad6eff2d4e82
https://publica.fraunhofer.de/entities/publication/04f62811-4694-42dd-b0d7-3e0bf382f165
https://publica.fraunhofer.de/entities/publication/057d6106-e284-48fe-b13f-8f5deb466928
https://publica.fraunhofer.de/entities/publication/00d6e3ee-75a0-4441-92d0-a2774a0bc932
https://publica.fraunhofer.de/entities/publication/011b0666-eb7b-403a-8d21-a488014913bd
https://publica.fraunhofer.de/entities/publication/00da4f76-a9d4-4d7d-864e-2885902e2513
https://publica.fraunhofer.de/entities/publication/0516558a-d28e-4025-a1da-48ba6f785dde
https://publica.fraunhofer.de/entities/publication/00f13890-af9d-4842-bfb7-3db2caed52fc
https://publica.fraunhofer.de/entities/publication/0569e904-9f03-44ea-9b7c-a9053026fc0b
https://publica.fraunhofer.de/entities/publication/010796b4-1747-46b6-839e-6e9ff89c6350
https://publica.fraunhofer.de/entities/publication/011ef6ae-3989-4ccd-9f07-0c2acc487c95
https://publica.fraunhofer.de/entities/publication/04ffc1b8-606c-4f7c-be0f-bc0af69c7ea9
https://publica.fraunhofer.de/entities/publication/00919ffa-187a-4db8-bde0-fc7123448fe5
https://publica.fraunhofer.de/entities/publication/00719f53-1982-43c0-9a0c-6e1ad7f29718
https://publica.fraunhofer.de/entities/publication/001bd35c-5f8c-40e4-848d-875413389ce4
https://publica.fraunhofer.de/entities/publication/00131bd2-cb98-4b6f-ac53-40da30a5a8b7
https://publica.fraunhofer.de/entities/publication/00a233ae-9712-4127-be12-107c43c44c06
https://publica.fraunhofer.de/entities/publication/00a049d4-b5ea-4e29-b98c-d57a78a70774
https://publica.fraunhofer.de/entities/publication/00cb80cc-4ae3-4a5d-8ab3-a3c586bceeef
https://publica.fraunhofer.de/entities/publication/0080a1fa-3f65-41c2-90f4-0033286aa5b3
https://publica.fraunhofer.de/entities/publication/000eb1b3-a548-491a-9010-065d60f60a91
https://publica.fraunhofer.de/entities/publication/00534451-e15d-4c6a-83fd-64b4f9abf518
https://publica.fraunhofer.de/entities/publication/023cf52a-65cb-4843-bbc9-1584a9f93b8a
https://publica.fraunhofer.de/entities/publication/040becb7-5926-4cac-94d3-d93bdd7960fb
https://publica.fraunhofer.de/entities/publication/004f4332-8703-49a7-9c9a-c3ca25f8d426
https://publica.fraunhofer.de/entities/publication/02b370d4-48af-4ea5-9af0-1015538ac557
https://publica.fraunhofer.de/entities/publication/042a878d-9617-4777-b02c-76931d36e2b4
https://publica.fraunhofer.de/entities/publication/00466565-cc24-48b5-a325-d7123f5d120b
https://publica.fraunhofer.de/entities/publication/041d8386-27ae-4938-9991-491d1626f209
https://publica.fraunhofer.de/entities/publication/02b14749-8906-4c11-97e4-5fd3e126e3f4
https://publica.fraunhofer.de/entities/publication/e23e0d0c-f0c9-4341-8ef4-c44fa5974968
https://publica.fraunhofer.de/entities/publication/d65d48ba-2b40-451d-b806-c87711fb3b64
https://publica.fraunhofer.de/entities/publication/0437753e-52ed-40c2-a315-c317f384c41b
https://publica.fraunhofer.de/entities/publication/e3c445cc-ca29-4c78-83c1-de37dd8152e6
https://publica.fraunhofer.de/entities/publication/df90ab6e-4a0e-4cca-93f6-501dbc39164e
https://publica.fraunhofer.de/entities/publication/03005f1e-4f35-4754-a2ef-0edd12c4f52f
https://publica.fraunhofer.de/entities/publication/e2fb56a0-3714-47d1-9a45-b309e8ca1f1a
https://publica.fraunhofer.de/entities/publication/d6485eb1-4bde-4eb1-81f6-7aa0bac1fe97
https://publica.fraunhofer.de/entities/publication/e23d4028-f59a-4c89-9b94-146fb21ff497
https://publica.fraunhofer.de/entities/publication/fabf3a3d-84a9-46f4-859d-ed6ad2217e93
https://publica.fraunhofer.de/entities/publication/faa1adf7-9452-4120-b7a2-f287ba1b8b13
https://publica.fraunhofer.de/entities/publication/e05bad08-ca6a-4e1d-a6fb-4e600b4b133a
https://publica.fraunhofer.de/entities/publication/dfcf1966-d3ce-492f-b26c-2b0b2aaee618
https://publica.fraunhofer.de/entities/publication/e1acbac4-098c-4b04-99e8-e012f96db6db
https://publica.fraunhofer.de/entities/publication/df57c39d-27d3-48ba-bb9c-7c4e467b2f5b
https://publica.fraunhofer.de/entities/publication/e1f6ca3a-2b6f-412b-9529-0e31db3d9ddc
https://publica.fraunhofer.de/entities/publication/fab0ff68-c08b-46d5-9045-21caf1e22df0
https://publica.fraunhofer.de/entities/publication/e2bc22c6-8da5-41d0-861e-d99b27d1bb7d
https://publica.fraunhofer.de/entities/publication/fb22d5c5-535e-445f-b7a4-9bf73231bc43
https://publica.fraunhofer.de/entities/publication/fb4b6805-07c9-4eed-8e08-e2eaaf984321
https://publica.fraunhofer.de/entities/publication/fb06a42d-5f2b-43b6-8af3-3aaec6fd3fbc
https://publica.fraunhofer.de/entities/publication/fad420c0-10a9-4c28-842a-ce76dfb550c8
https://publica.fraunhofer.de/entities/publication/fb0c2afc-367f-4797-86d6-f913b1343e32
https://publica.fraunhofer.de/entities/publication/faf804d0-fa1c-43df-a141-b48536b1b167
https://publica.fraunhofer.de/entities/publication/fb208bc8-264e-46be-97ba-96ae995c84ee
https://publica.fraunhofer.de/entities/publication/facef8fe-dc21-4a33-a2f8-ac4c2780982e
https://publica.fraunhofer.de/entities/publication/fb1c99c7-831c-407f-b628-4b3ebebeea9a
https://publica.fraunhofer.de/entities/publication/fa83f113-c6e6-4bdf-bdb4-701efaa494ba
https://publica.fraunhofer.de/entities/publication/fb61726b-8629-4c89-8cfd-5da3bd0d6d14
https://publica.fraunhofer.de/entities/publication/fb5d944d-8965-4abf-a4bb-2316c74c0ded
https://publica.fraunhofer.de/entities/publication/fb6b4f1a-e340-4526-9683-c5f96ce5bbb3
https://publica.fraunhofer.de/entities/publication/fb6d8dc0-949b-4429-90ef-9cb693bd3fb9
https://publica.fraunhofer.de/entities/publication/fb596043-3cca-4b87-bd6b-7131770cefc5
https://publica.fraunhofer.de/entities/publication/fb9df928-61d3-435d-b5f0-bf8cbd47ae21
https://publica.fraunhofer.de/entities/publication/fb577d6b-df4d-45fb-89dd-4c5c345d06f9
https://publica.fraunhofer.de/entities/publication/fbb8a96c-c007-4efa-9420-dd8feb2ad494
https://publica.fraunhofer.de/entities/publication/fbd6b2e6-bcf3-4e5b-ac8c-962e8d1c7914
https://publica.fraunhofer.de/entities/publication/fc6c1204-8f8f-41b8-95b7-c31d9b77917e
https://publica.fraunhofer.de/entities/publication/fbc07169-ecb1-4e4d-9965-ea0189c9ed41
https://publica.fraunhofer.de/entities/publication/fc65c7ab-7a8e-4e24-8d38-9d27baa3427a
https://publica.fraunhofer.de/entities/publication/fc72c87e-dfe7-44d4-9596-8f8bb12cee5d
https://publica.fraunhofer.de/entities/publication/fc7f9a20-c916-4da1-bbe9-e508b6515fca
https://publica.fraunhofer.de/entities/publication/fbd40967-5716-467c-b330-d74480a38949
https://publica.fraunhofer.de/entities/publication/fbdb0ae9-19ee-4dd1-9bba-b9a6745bae96
https://publica.fraunhofer.de/entities/publication/fc0d7509-7578-47de-a79c-22eefc4216e8
https://publica.fraunhofer.de/entities/publication/fc523e6d-b831-491e-9c62-3f8791e3fbba
https://publica.fraunhofer.de/entities/publication/fbf39c4f-f091-4369-bfb6-a130f64bb71b
https://publica.fraunhofer.de/entities/publication/fc17deb4-1a7c-4ea3-a30b-791a88d86e17
https://publica.fraunhofer.de/entities/publication/fbdb2914-fee2-443b-80f5-baa4a9f10a7b
https://publica.fraunhofer.de/entities/publication/fbf8a661-d4b1-47da-bf91-bc3760af85dd
https://publica.fraunhofer.de/entities/publication/fbe17494-922d-4f47-af83-60aed88ca278
https://publica.fraunhofer.de/entities/publication/ffa5ac77-d91c-4886-bccf-009b0a852482
https://publica.fraunhofer.de/entities/publication/ffa2c6a1-39da-40d1-84d9-5316a3771fae
https://publica.fraunhofer.de/entities/publication/f0d61ef0-93c9-430c-b625-4109ab639fe4
https://publica.fraunhofer.de/entities/publication/ff87557e-79bd-4994-bd93-757752ccb508
https://publica.fraunhofer.de/entities/publication/f9d5c1b0-cd8f-46b6-ba5c-a658598ae53f
https://publica.fraunhofer.de/entities/publication/ffb4018d-0976-4b90-915e-c0adddedf15c
https://publica.fraunhofer.de/entities/publication/fb3023d3-e4ce-4faf-adc8-bc5816c3a4b1
https://publica.fraunhofer.de/entities/publication/fa1e10e7-3d1c-4f04-af5a-6f84f55cae44
https://publica.fraunhofer.de/entities/publication/faedff97-52ae-4818-aeaa-829060fac08a
https://publica.fraunhofer.de/entities/publication/ff5fb725-8b49-4aab-80bd-24629db1b4e1
https://publica.fraunhofer.de/entities/publication/ff6bf85e-7cfb-4fe9-a31c-a6ab774b20b0
https://publica.fraunhofer.de/entities/publication/ff46ae30-e548-4bfb-8c68-fb995009c74f
https://publica.fraunhofer.de/entities/publication/ff17359b-c9f2-45e9-bcc1-52c331e45a63
https://publica.fraunhofer.de/entities/publication/ffdc8426-a562-4868-b0a5-123b626aef7c
https://publica.fraunhofer.de/entities/publication/ff527033-d57a-4453-90f1-b9e360ecd0c7
https://publica.fraunhofer.de/entities/publication/ffc4e3d0-00df-46b5-844b-942826cacf38
https://publica.fraunhofer.de/entities/publication/ffbd56a8-0535-4b46-922f-2ae914311d1e
https://publica.fraunhofer.de/entities/publication/ff6719b6-576b-4ef1-afbe-c597bda4c22c
https://publica.fraunhofer.de/entities/publication/817305f5-5393-4797-8829-6b3d79db63ff
https://publica.fraunhofer.de/entities/publication/fea69c00-e226-4c17-9a30-9f753a4b5c2b
https://publica.fraunhofer.de/entities/publication/fff04d00-5c11-489f-9d9a-54d0b369adb1
https://publica.fraunhofer.de/entities/publication/ff306905-ff21-4fdc-a8a1-b01793959d65
https://publica.fraunhofer.de/entities/publication/feea7a9a-bdc0-482c-9e5d-db3d0b3d1924
https://publica.fraunhofer.de/entities/publication/fee7f339-dd5f-418f-8ff0-50af3e971ce3
https://publica.fraunhofer.de/entities/publication/ffe2c66b-8278-434b-bf1c-c838fadf0a45
https://publica.fraunhofer.de/entities/publication/fe2d5c86-8802-4e3c-9c94-c3b9ff8217df
https://publica.fraunhofer.de/entities/publication/ddb22f5a-0747-44d1-9dd2-22a3a4edfc62
https://publica.fraunhofer.de/entities/publication/973b795f-2f09-4e5e-a4c1-5a4ae3e2450f
https://publica.fraunhofer.de/entities/publication/72536545-cd02-499a-b541-78828f093e51
https://publica.fraunhofer.de/entities/publication/31b667d3-1fe7-421e-ab3e-ab819962293b
https://publica.fraunhofer.de/entities/publication/0f64fb1b-48b4-4f6f-896c-1fe4089bd2bd
https://publica.fraunhofer.de/entities/publication/0f7a401c-7c8d-4bc6-9717-942b9d50600a
https://publica.fraunhofer.de/entities/publication/91b74b49-767d-4620-9070-b8c566952000
https://publica.fraunhofer.de/entities/publication/0f72ebfe-97c1-4dd3-9eae-12af773a2737
https://publica.fraunhofer.de/entities/publication/10d5f2eb-e2c9-42b0-b183-40aee30cf06a
https://publica.fraunhofer.de/entities/publication/10af8efa-d4ac-47e6-a25c-f9ea7d440f97
https://publica.fraunhofer.de/entities/publication/0f7cf900-60ca-4562-82fb-4582cb80bd72
https://publica.fraunhofer.de/entities/publication/10bc3dfd-fc10-4e14-b944-3f44ce8e251d
https://publica.fraunhofer.de/entities/publication/0c5e8856-031e-4cc3-bf34-49dd69f4ae8a
https://publica.fraunhofer.de/entities/publication/5c7b882f-91e1-4f89-baae-cc66836451c2
https://publica.fraunhofer.de/entities/publication/5d02dab1-5ad4-423d-8241-711f0dd34207
https://publica.fraunhofer.de/entities/publication/5c78ac81-e0e8-456d-9369-ce2c40a2c4aa
https://publica.fraunhofer.de/entities/publication/5c00023d-7081-41f7-8fec-2a1bbbc05eda
https://publica.fraunhofer.de/entities/publication/5c722fc6-bc54-4cda-af11-9f39a82b1a41
https://publica.fraunhofer.de/entities/publication/5d0fd86a-1b5e-49a4-8147-745c7eb8b44a
https://publica.fraunhofer.de/entities/publication/5b53c32b-f328-4462-ae51-0368201bef71
https://publica.fraunhofer.de/entities/publication/5c776114-fe6a-4560-8468-5cec0409a909
https://publica.fraunhofer.de/entities/publication/5c383b69-84ce-4688-a3ca-4649796da162
https://publica.fraunhofer.de/entities/publication/5c29f3d1-a824-4a9f-9dd0-ef7012798ef5
https://publica.fraunhofer.de/entities/publication/5c13bf26-52d9-4fc4-8844-d6035adce808
https://publica.fraunhofer.de/entities/publication/5cc23dee-1efb-42df-bd44-a1ac5755537b
https://publica.fraunhofer.de/entities/publication/5cbcc7d3-e5d5-47c9-9713-5fe8864fc11c
https://publica.fraunhofer.de/entities/publication/5cb9874a-c6eb-473f-b28d-27f96a54453d
https://publica.fraunhofer.de/entities/publication/58aeb558-43d0-457d-9326-90b829112416
https://publica.fraunhofer.de/entities/publication/5c3c3e18-1d65-463e-98a4-89da1f2641f6
https://publica.fraunhofer.de/entities/publication/5abb8c30-c5c0-40d7-8044-76b92b05b956
https://publica.fraunhofer.de/entities/publication/5978a9b2-263f-4a60-827b-8fcef3906ace
https://publica.fraunhofer.de/entities/publication/5a3435c1-727b-4996-a426-2757b091e392
https://publica.fraunhofer.de/entities/publication/5a36cd31-0788-45be-a94b-a4be4cd3fa35
https://publica.fraunhofer.de/entities/publication/5a1dcf1f-434f-473e-a4f7-60e0027d02b9
https://publica.fraunhofer.de/entities/publication/5ad9f73b-f7f1-4f00-955a-1f7f4bb10ced
https://publica.fraunhofer.de/entities/publication/5aa75b2f-f685-4baa-9157-217301f719ef
https://publica.fraunhofer.de/entities/publication/5aae7ca2-5765-4b59-b756-a61728d2c559
https://publica.fraunhofer.de/entities/publication/5b1c8b05-bb21-4d54-8ecf-b2c504605c6b
https://publica.fraunhofer.de/entities/publication/5aff2e85-2b48-4d49-93a0-ec1de172bcef
https://publica.fraunhofer.de/entities/publication/5b103fa7-aaa3-4fc7-9c3c-12ffd23ffb90