https://publica.fraunhofer.de/entities/publication/b3dda4b8-a54b-4248-846b-355cf00386ed
https://publica.fraunhofer.de/entities/publication/bf19890d-c732-4cc2-8155-f0411d0c48a8
https://publica.fraunhofer.de/entities/publication/847eaa34-8f87-43f1-926a-6afade26c931
https://publica.fraunhofer.de/entities/publication/8ef75d2e-16e5-4e61-a8f6-d15b090f1e01
https://publica.fraunhofer.de/entities/publication/087bff46-9aba-4034-a9ad-d3b52258b3b8
https://publica.fraunhofer.de/entities/publication/459445ad-af41-4420-993b-841e2ad68ea9
https://publica.fraunhofer.de/entities/publication/4120137d-50da-440d-b31f-b34911bb0e63
https://publica.fraunhofer.de/entities/publication/a9c351d8-fbf1-44a5-89af-b9e36a0185a5
https://publica.fraunhofer.de/entities/publication/9376b183-a4b5-4183-bef0-842c89b31aa7
https://publica.fraunhofer.de/entities/publication/2426f570-36c5-4d91-9089-78fd3ed6e19a
https://publica.fraunhofer.de/entities/publication/6e4084ca-982d-4945-b7b1-62dd8d14f69e
https://publica.fraunhofer.de/entities/publication/594d9a90-72ac-4f40-abb7-923f5c586d12
https://publica.fraunhofer.de/entities/publication/1c02cb1a-6388-443f-8f93-47f4875cd799
https://publica.fraunhofer.de/entities/publication/ddb00c67-0621-4a17-a563-9fabe5f370f0
https://publica.fraunhofer.de/entities/publication/c0f339c9-1bc6-4dad-8122-d2abaebad903
https://publica.fraunhofer.de/entities/publication/f705902c-286a-42a9-a7cf-87ee91952b97
https://publica.fraunhofer.de/entities/publication/23c302be-0a88-4126-8193-8d73ca7867c0
https://publica.fraunhofer.de/entities/publication/34d6cf72-f816-4158-8817-15957ce4c43d
https://publica.fraunhofer.de/entities/publication/39e43d32-8d6d-4306-9a4a-05fef8b3a1f6
https://publica.fraunhofer.de/entities/publication/29319be6-4080-486b-bc3d-9ee68274e785
https://publica.fraunhofer.de/entities/publication/34d5335b-815f-4df8-8d6a-c6b3cf61f982
https://publica.fraunhofer.de/entities/publication/3a7c3181-1f86-47f2-a36e-a4a3edfa462d
https://publica.fraunhofer.de/entities/publication/3b720868-2345-413c-aafc-ec0569c8c03e
https://publica.fraunhofer.de/entities/publication/39cac369-3cc5-4b81-a656-4cce7db82cde
https://publica.fraunhofer.de/entities/publication/2889688a-2300-4329-83bb-e64eeb19f2af
https://publica.fraunhofer.de/entities/publication/22efdd8b-eb26-4086-be93-383135ac6844
https://publica.fraunhofer.de/entities/publication/35154d8d-a340-4c93-b149-bd8e532a1996
https://publica.fraunhofer.de/entities/publication/2502a5f7-87a3-491c-acf7-0153cd116e9c
https://publica.fraunhofer.de/entities/publication/3560ee11-5506-4a83-b42a-e0581db81899
https://publica.fraunhofer.de/entities/publication/21798c05-cd2a-4335-b738-e2cec9cc7fe7
https://publica.fraunhofer.de/entities/publication/357ad14c-b8fb-4a5b-9c0f-a9e76043d036
https://publica.fraunhofer.de/entities/publication/30f2b8a7-ddff-43d0-aad9-4e851ce869e7
https://publica.fraunhofer.de/entities/publication/2b33b982-39e5-4ba7-980a-03aeb55f1a14
https://publica.fraunhofer.de/entities/publication/2bd96266-b35f-40c9-905b-acf1d9dcf7d4
https://publica.fraunhofer.de/entities/publication/47b78ea9-92de-43ae-ae80-a55b882719eb
https://publica.fraunhofer.de/entities/publication/4737fa8f-5034-40ac-8818-4d1df45898ca
https://publica.fraunhofer.de/entities/publication/5080dfb6-605d-4b7a-b0d5-ab2b9d2b712d
https://publica.fraunhofer.de/entities/publication/4fdd0038-9083-44e1-aeba-48d514465ac6
https://publica.fraunhofer.de/entities/publication/43666230-fcac-4067-815e-e73d2a54f13f
https://publica.fraunhofer.de/entities/publication/424070a6-abec-4d41-9bd7-0b603f520fb7
https://publica.fraunhofer.de/entities/publication/42c8a72d-b8f9-4710-89bd-c6be4eafc60f
https://publica.fraunhofer.de/entities/publication/30402e22-3170-4eea-926d-33a3e55d571c
https://publica.fraunhofer.de/entities/publication/484d49d5-ea23-4e8a-90e1-5576a3a18aaa
https://publica.fraunhofer.de/entities/publication/4f69df6a-8f36-449f-8ffc-c9ffd5854c39
https://publica.fraunhofer.de/entities/publication/27bc0cfa-fca9-41c6-a96f-6b5dc2c6fde5
https://publica.fraunhofer.de/entities/publication/3716d229-28ad-4658-b5f9-a5a2990bbf97
https://publica.fraunhofer.de/entities/publication/1c998d66-0799-4a06-963f-2e07c9b64193
https://publica.fraunhofer.de/entities/publication/513c21a2-45e8-4186-a6ce-3bec4defd168
https://publica.fraunhofer.de/entities/publication/4f60de75-f54b-42cc-9b1c-28f4ebcf83ee
https://publica.fraunhofer.de/entities/publication/4eb61963-1d3a-4c99-ad5b-1313619549ab
https://publica.fraunhofer.de/entities/publication/36a6c67a-8e80-45ff-a7a4-d671d0995c8e
https://publica.fraunhofer.de/entities/publication/25a385c4-dbc9-4ef5-943e-aa0feb03508f
https://publica.fraunhofer.de/entities/publication/1d25908d-48c5-4a34-af7e-bec6eb6f6919
https://publica.fraunhofer.de/entities/publication/106ba246-b08e-4a14-8ff5-2f2b71f32df4
https://publica.fraunhofer.de/entities/publication/11a977e2-6066-4e79-97fb-2e96463e5cf6
https://publica.fraunhofer.de/entities/publication/1412b543-d8dd-41b4-867a-186d2c13ce9a
https://publica.fraunhofer.de/entities/publication/19ba59ba-ad54-4d04-a52a-2b01336bcc35
https://publica.fraunhofer.de/entities/publication/109e7209-2a4b-4eb0-8c82-7d553949bc3c
https://publica.fraunhofer.de/entities/publication/1187d778-8d89-4aa7-aa73-610f499b0235
https://publica.fraunhofer.de/entities/publication/15440d8f-2c63-45eb-aef2-c24ed96bd126
https://publica.fraunhofer.de/entities/publication/13cf68cf-9096-45b8-8416-7c941986f223
https://publica.fraunhofer.de/entities/publication/0d53cc0f-0d81-4752-a1f5-a86c1c76c626
https://publica.fraunhofer.de/entities/publication/17d7b1c1-06bc-491e-bb89-602362816bbe
https://publica.fraunhofer.de/entities/publication/ad63421b-92c8-423e-bfdc-44513c964ad6
https://publica.fraunhofer.de/entities/publication/adac2987-0443-44f4-a338-23a31ad46d24
https://publica.fraunhofer.de/entities/publication/ad131630-1a05-421a-8510-9485484f28e2
https://publica.fraunhofer.de/entities/publication/77aea127-6b48-4715-9e65-8ee8de21b657
https://publica.fraunhofer.de/entities/publication/171cd261-ff3d-46dd-93f2-3b80942deb4f
https://publica.fraunhofer.de/entities/publication/a9d75490-307e-4ddf-b163-feb2df50ed4f
https://publica.fraunhofer.de/entities/publication/b721826e-ac77-447f-b918-b231ab65221e
https://publica.fraunhofer.de/entities/publication/bd0c7002-4740-4266-b535-bb6227f87265
https://publica.fraunhofer.de/entities/publication/93b60a2b-8e52-4404-b8e8-27fb351c3eb5
https://publica.fraunhofer.de/entities/publication/b257d024-0166-4258-a737-0ccd185bc03f
https://publica.fraunhofer.de/entities/publication/a52a03db-4a4b-46ee-9511-dec966825103
https://publica.fraunhofer.de/entities/publication/b3327394-ed9c-4853-baf3-ae2a6241e8e9
https://publica.fraunhofer.de/entities/publication/a5ad3233-f6e5-4691-88a4-bfe5d2ce8473
https://publica.fraunhofer.de/entities/publication/b70810d0-872f-4ac0-bc53-5731c374ce96
https://publica.fraunhofer.de/entities/publication/8184bc3c-ed07-4244-9558-3acec002a1e2
https://publica.fraunhofer.de/entities/publication/c1cecb3e-e3d6-4d48-94d5-01e7b975b873
https://publica.fraunhofer.de/entities/publication/87354150-6afc-4d69-be97-7f8e28ec4023
https://publica.fraunhofer.de/entities/publication/692a3082-8c50-4315-9148-a530a1d9c94f
https://publica.fraunhofer.de/entities/publication/7283e831-97cf-42af-8121-37b5c2fc84d7
https://publica.fraunhofer.de/entities/publication/bf05fd60-f3af-4213-bbc0-a9bfd4048941
https://publica.fraunhofer.de/entities/publication/71a7d8ad-371e-4e12-a8aa-3707ab30b4c2
https://publica.fraunhofer.de/entities/publication/7c787f55-6532-413d-adcc-c3bc0ad9480c
https://publica.fraunhofer.de/entities/publication/718fe683-9801-480c-a110-72de8aeac450
https://publica.fraunhofer.de/entities/publication/562af7f9-ae5f-439a-ad53-272b4351f6f7
https://publica.fraunhofer.de/entities/publication/7305bff1-9681-4928-a7cd-f9a790ee3907
https://publica.fraunhofer.de/entities/publication/5af32b78-6a84-42f1-b8e6-408e2b478d20
https://publica.fraunhofer.de/entities/publication/62b444eb-a7bf-488c-88f6-ea9a495e5be6
https://publica.fraunhofer.de/entities/publication/76c2b5fe-ef01-475d-a8ee-6f2ce4886a8c
https://publica.fraunhofer.de/entities/publication/56a22b79-14d0-4939-8a20-69a91e2dfd5b
https://publica.fraunhofer.de/entities/publication/74db324c-6ecc-49b6-92ed-0b4b3b22735d
https://publica.fraunhofer.de/entities/publication/63600169-fd74-4d38-b80f-9d7ec81f1f6f
https://publica.fraunhofer.de/entities/publication/9bd71906-0608-422c-af17-db3855c40084
https://publica.fraunhofer.de/entities/publication/33310a78-d782-48d0-b576-c0fcfb80a8f4
https://publica.fraunhofer.de/entities/publication/32f05cab-c675-4a86-891a-796ed3ed25fb
https://publica.fraunhofer.de/entities/publication/8675458d-17a5-49e1-bd02-3ad49bdf7829
https://publica.fraunhofer.de/entities/publication/4d135804-31d5-4b71-bc35-1779f609f9b6
https://publica.fraunhofer.de/entities/publication/85d804e4-99b1-4e0f-872a-9f3407ef191b
https://publica.fraunhofer.de/entities/publication/62f331a8-233e-48ed-9523-14716ce4d677
https://publica.fraunhofer.de/entities/publication/9c478548-1c06-439f-b3b8-5a22069fd66c
https://publica.fraunhofer.de/entities/publication/9b7973bf-8e3c-4602-9d28-70d3a1f849a8
https://publica.fraunhofer.de/entities/publication/7bf4fad5-722a-4bfb-8c6a-9de0745d7024
https://publica.fraunhofer.de/entities/publication/9308fc21-117b-4af9-a856-99f2554d4974
https://publica.fraunhofer.de/entities/publication/8e650bf9-0cea-4cc2-b242-1e613040227e
https://publica.fraunhofer.de/entities/publication/5725b009-2ea3-4e30-8bb6-22c5058dab93
https://publica.fraunhofer.de/entities/publication/93f8a739-ab74-433e-b4a4-2cf395e6387a
https://publica.fraunhofer.de/entities/publication/d4fc8016-6043-41cf-a801-9c4d5d1e7eb8
https://publica.fraunhofer.de/entities/publication/96996118-dfed-460a-95c2-e0feaaa547df
https://publica.fraunhofer.de/entities/publication/97c9129f-ee21-456e-96d7-e3fbea7481b1
https://publica.fraunhofer.de/entities/publication/8be5a55f-72e4-4f26-9b2c-05971cee47fd
https://publica.fraunhofer.de/entities/publication/e95a944c-5503-4085-be4f-ca35722240da
https://publica.fraunhofer.de/entities/publication/e6f64486-543f-46fd-8aef-71beca8a969b
https://publica.fraunhofer.de/entities/publication/db4d4c4f-9b47-4ea1-a6a2-5d8805f053e7
https://publica.fraunhofer.de/entities/publication/df66a816-f437-4ec3-83d6-62a621b264e9
https://publica.fraunhofer.de/entities/publication/d512aca8-6793-4fac-ad0b-408404cd0ce6
https://publica.fraunhofer.de/entities/publication/e6d85d3c-06fb-43ff-85c2-16495001b46d
https://publica.fraunhofer.de/entities/publication/df8e8820-6979-41bb-b84e-53b102164c5c
https://publica.fraunhofer.de/entities/publication/e0bc76ca-063d-4d9f-bbee-6220cb307a7d
https://publica.fraunhofer.de/entities/publication/ea800ed3-6c74-4895-a986-3d637fd3530b
https://publica.fraunhofer.de/entities/publication/f0b42fc9-3916-4aaa-9e72-2abb6e7f3105
https://publica.fraunhofer.de/entities/publication/ee55d789-315d-43cf-a2ee-b19aefe35d41
https://publica.fraunhofer.de/entities/publication/c7f6be6c-e064-4038-b72c-ae7eb5c70381
https://publica.fraunhofer.de/entities/publication/daceae53-eb4f-4bff-8bdb-43f3f278048b
https://publica.fraunhofer.de/entities/publication/efc3f5a1-bc0a-498d-b200-f1badc5da487
https://publica.fraunhofer.de/entities/publication/e58e2411-2cac-4b5d-a147-579dc3155358
https://publica.fraunhofer.de/entities/publication/f0e7068a-71dd-47b3-8e6a-0167b669d22c
https://publica.fraunhofer.de/entities/publication/ef5e18a3-709a-432c-8a05-57f988949764
https://publica.fraunhofer.de/entities/publication/f02b0c0b-2b27-4059-8887-478ff0bbe1de
https://publica.fraunhofer.de/entities/publication/cf08276a-afa5-4f45-a2d7-790f72c9bbd2
https://publica.fraunhofer.de/entities/publication/ba910493-e2c5-4d76-9a3f-23329de37b07
https://publica.fraunhofer.de/entities/publication/ccd1565f-1c68-417f-92c1-9ef630955624
https://publica.fraunhofer.de/entities/publication/c6a1cec7-531a-4373-9ab8-8ff1e88a0c1a
https://publica.fraunhofer.de/entities/publication/bac19c7a-ed24-416d-a29b-3758572723b5
https://publica.fraunhofer.de/entities/publication/cefa0788-0559-43b5-8a57-0cc78d683bd0
https://publica.fraunhofer.de/entities/publication/c771f1f8-534b-497a-bd5c-246ed2cec629
https://publica.fraunhofer.de/entities/publication/ba2cf1a3-a7d4-4bcc-ab46-ba348522ac86
https://publica.fraunhofer.de/entities/publication/d0bb3b9a-791f-42d2-8712-37bdc238d32a
https://publica.fraunhofer.de/entities/publication/fe439df8-f14f-494c-8f9f-0105870dc8d6
https://publica.fraunhofer.de/entities/publication/b5c6b7bd-bd78-4298-9246-7ef06c102c8d
https://publica.fraunhofer.de/entities/publication/ddd8115d-6cef-4a18-802a-8e4ad73c780d
https://publica.fraunhofer.de/entities/publication/f5c784da-1561-4808-ae21-ff6a6b255505
https://publica.fraunhofer.de/entities/publication/861d927a-7916-4efc-b1d6-af74e31fb4b7
https://publica.fraunhofer.de/entities/publication/cf926dd7-79bf-4034-892b-c16026089561
https://publica.fraunhofer.de/entities/publication/f95ce8cb-05e1-4588-9aa5-6e168a96deca
https://publica.fraunhofer.de/entities/publication/f8f8ff1d-936f-4625-a493-385325322ab4
https://publica.fraunhofer.de/entities/publication/2eba08d9-1279-4cd8-8f58-ab232dd08f7a
https://publica.fraunhofer.de/entities/publication/ec9f4839-60d3-45d9-adb9-07156d0e3472
https://publica.fraunhofer.de/entities/publication/43c1d7cf-2872-47e7-a80c-1d42b76431bb
https://publica.fraunhofer.de/entities/publication/408fd13a-4a78-4602-a819-37366737a75e
https://publica.fraunhofer.de/entities/publication/47bcdb31-b95a-4e5f-aaf5-42342f9c0e23
https://publica.fraunhofer.de/entities/publication/f3723599-b8a3-47a9-b920-eb307b6a3c12
https://publica.fraunhofer.de/entities/publication/1a08b954-5617-465b-bd01-74989998c9db
https://publica.fraunhofer.de/entities/publication/1db644d8-0c77-4e23-a752-419d4bd013a1
https://publica.fraunhofer.de/entities/publication/498dee29-7125-4227-b9c0-baa079e6c018
https://publica.fraunhofer.de/entities/publication/427d9cb1-7479-4f26-94ba-f58bca9360f0
https://publica.fraunhofer.de/entities/publication/1bff2ec0-6166-4d32-9349-7faae567de21
https://publica.fraunhofer.de/entities/publication/386e5bed-5279-45ee-a2c2-c158e9c7c254
https://publica.fraunhofer.de/entities/publication/44b40006-0883-442b-a3d4-59043b0a5d8f
https://publica.fraunhofer.de/entities/publication/430e901f-2d99-4094-bf48-90091617dd18
https://publica.fraunhofer.de/entities/publication/43057364-f251-4c48-8206-f8216839d97c
https://publica.fraunhofer.de/entities/publication/42fcfe3d-ad6f-4e3f-a137-3250b4e10528
https://publica.fraunhofer.de/entities/publication/44a8c508-3382-4bba-a096-10fbc600679d
https://publica.fraunhofer.de/entities/publication/4319a821-5a72-42f7-949b-d412b8706217
https://publica.fraunhofer.de/entities/publication/44a5091f-686b-4ff9-b1dc-e27d836674f1
https://publica.fraunhofer.de/entities/publication/458670ca-d30e-44c0-abf8-1a72b878852c
https://publica.fraunhofer.de/entities/person/56ea5f4a-c6a0-4c51-a71f-38e866d48a40
https://publica.fraunhofer.de/entities/publication/4616f7ef-aa71-4604-abd8-b850e3fcd58f
https://publica.fraunhofer.de/entities/publication/468b09ad-7620-4ff7-97ea-62a9e6f5fd17
https://publica.fraunhofer.de/entities/publication/46828c86-b392-41d9-a27f-f7d77fd00de0
https://publica.fraunhofer.de/entities/publication/46182f07-ecf1-43de-9969-059de7e5df32
https://publica.fraunhofer.de/entities/publication/462450fc-2508-46e4-b7cd-946e85dfdde1
https://publica.fraunhofer.de/entities/publication/4613dc19-b7be-4e36-8ce9-8b7ee3f1b432
https://publica.fraunhofer.de/entities/publication/46141419-eb30-4fa1-9fd8-e6da04700279
https://publica.fraunhofer.de/entities/publication/463ea00d-4d60-466e-8f8c-201e877b60cf
https://publica.fraunhofer.de/entities/publication/462d2fa3-d095-40c5-bc13-f015f1f74ac2
https://publica.fraunhofer.de/entities/publication/44b7c1ad-4c70-450c-85af-847d8440349e
https://publica.fraunhofer.de/entities/publication/44d1ec70-6554-4a51-b9a0-f4b50cafeba5
https://publica.fraunhofer.de/entities/publication/44c84819-ac58-4e62-b34d-f49e97f21179
https://publica.fraunhofer.de/entities/publication/45f797e3-2437-4b4a-83df-d0fef10cb38b
https://publica.fraunhofer.de/entities/publication/44ba5219-894f-405f-852c-af20c894dee9
https://publica.fraunhofer.de/entities/publication/44d26358-27f4-4141-abae-345f761f415e
https://publica.fraunhofer.de/entities/publication/45e9d833-c1aa-4ec2-a0f5-8a539ce8ae24
https://publica.fraunhofer.de/entities/publication/46095448-d414-4308-b50f-c3eed3ffaeb7
https://publica.fraunhofer.de/entities/publication/45e6d577-9830-432a-9dfb-c53918a5ee55
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