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  4. Application oriented On-The-Edge Capable Prognostic and Health Monitoring Framework for Solder Joints in Electronics
 
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2024
Conference Paper
Title

Application oriented On-The-Edge Capable Prognostic and Health Monitoring Framework for Solder Joints in Electronics

Abstract
In today’s fast-paced and highly interconnected world, digitization is a significant driving force across various sectors, with electronic systems being backbone of this. Increasing number of electronic devices are being manufactured which introduces significant reliability challenges. Prognostic and Health Monitoring (PHM) is one such discipline which employs methods to develop a strategy of electronic systems monitoring and failure prediction. It is a challenging task to establish such framework which combines the precursors, information on failure mechanisms, and quick prediction which allows users to be aware of the impending failures in advance. In this article, we propose a tailored and tested PHM approach for failure prediction of solder joints, one of the most prone elements in electronics. A machine learning model is first trained with the synthetically generated solder damage data. It is then utilized in the PHM framework, whose primary focus lies on the realization of life estimation of solder joints as a portable solution. The methodology is implemented with two microcontrollers including comprehensive study on model conversion, model compression and model degradation. The framework is then validated with the field mission profile data acquired from the eBikes and associated data pre-processing steps and memory limitations are discussed.
Author(s)
Bhat, Darshankumar  orcid-logo
Fraunhofer-Institut für Keramische Technologien und Systeme IKTS  
Münch, Stefan  
Fraunhofer-Institut für Keramische Technologien und Systeme IKTS  
Röllig, Mike  
Fraunhofer-Institut für Keramische Technologien und Systeme IKTS  
Mainwork
25th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2024  
Conference
International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems 2024  
DOI
10.1109/EuroSimE60745.2024.10491479
Language
English
Fraunhofer-Institut für Keramische Technologien und Systeme IKTS  
Keyword(s)
  • Micromechanical devices

  • Microcontrollers

  • Machine Learning

  • Life estimation

  • Microelectronics

  • Reliability

  • Soldering

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