• English
  • Deutsch
  • Log In
    Password Login
    Research Outputs
    Fundings & Projects
    Researchers
    Institutes
    Statistics
Repository logo
Fraunhofer-Gesellschaft
  1. Home
  2. Fraunhofer-Gesellschaft
  3. Konferenzschrift
  4. MOCVD of ferroelectric thin films
 
  • Details
  • Full
Options
1997
Conference Paper
Title

MOCVD of ferroelectric thin films

Abstract
A low pressure chemical vapor deposition system for growing ferroelectric thin films of lead-zirkonate-titanate has been developed. The liquid metal precursors are dosed by up to four self-contained dispense systems with vaporizers. The deposition is carried out in a cold-wall reactor at pressures below 1 Torr and at temperatures between 330 deg C and 450 deg C. The thickness of the deposited films ranged from 10 nm to 600 nm. The investigated films are lead-titanate PbTiO3 and lead-zirconate-titanate Pb(Zr,Ti)O3. They show high permittivity values and ferroelectric hysteresis of the electrical polarisation, which could be increased by post-deposition annealing.
Author(s)
Schmidt, C.
Burte, E.P.
Mainwork
Chemical vapor deposition. Proceedings of the fourteenth international conference and EUROCVD-11  
Conference
International Conference on Chemical Vapor Deposition (CVD) 1997  
EUROCVD 1997  
Electrochemical Society (Meeting) 1997  
Language
English
IIS-B  
Keyword(s)
  • Ferroelektrika

  • MOCVD

  • PZT

  • Cookie settings
  • Imprint
  • Privacy policy
  • Api
  • Contact
© 2024