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  4. MOCVD of ferroelectric thin films
 
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1997
  • Konferenzbeitrag

Titel

MOCVD of ferroelectric thin films

Abstract
A low pressure chemical vapor deposition system for growing ferroelectric thin films of lead-zirkonate-titanate has been developed. The liquid metal precursors are dosed by up to four self-contained dispense systems with vaporizers. The deposition is carried out in a cold-wall reactor at pressures below 1 Torr and at temperatures between 330 deg C and 450 deg C. The thickness of the deposited films ranged from 10 nm to 600 nm. The investigated films are lead-titanate PbTiO3 and lead-zirconate-titanate Pb(Zr,Ti)O3. They show high permittivity values and ferroelectric hysteresis of the electrical polarisation, which could be increased by post-deposition annealing.
Author(s)
Schmidt, C.
Burte, E.P.
Hauptwerk
Chemical vapor deposition. Proceedings of the fourteenth international conference and EUROCVD-11
Konferenz
International Conference on Chemical Vapor Deposition (CVD) 1997
EUROCVD 1997
Electrochemical Society (Meeting) 1997
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Language
Englisch
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  • Ferroelektrika

  • MOCVD

  • PZT

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