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  4. Torsional stress, fatigue and fracture strength in silicon hinges of a micro scanning mirror
 
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2004
Conference Paper
Title

Torsional stress, fatigue and fracture strength in silicon hinges of a micro scanning mirror

Abstract
Special micro scanning mirrors have been designed for the investigation of torsional stress in micro-scale hinges made of crystalline silicon. The setup with precise logging of resonant frequency and deflection amplitude of the MEMS-scanners is described. First results on fatigue and fracture strenght are presented. Fracture of torsion beams with 6.6 µm x 30 µm cross-section occured at 2.0 GPa to 2.4 GPa. No sign of fatigue was observed in operation for 512 h at 1.4 GPa torsional stress in resonance at 2260.7 Hz oscillation frequency. Measured frequency variation was 0.06 % without any trend.
Author(s)
Wolter, A.
Fraunhofer-Institut für Photonische Mikrosysteme IPMS  
Schenk, H.
Fraunhofer-Institut für Photonische Mikrosysteme IPMS  
Korth, H.
Fraunhofer-Institut für Photonische Mikrosysteme IPMS  
Lakner, H.
Fraunhofer-Institut für Photonische Mikrosysteme IPMS  
Mainwork
Reliability, testing, and characterization of MEMS/MOEMS III  
Conference
Conference on Reliability, Testing, and Characterization of MEMS/MOEMS 2004  
DOI
10.1117/12.524872
Language
English
Fraunhofer-Institut für Photonische Mikrosysteme IPMS  
Keyword(s)
  • micro scanning mirror

  • beam deflection

  • bulk-micromachining

  • MEMS

  • MOEMS

  • micro mirror

  • comb drive

  • torsional stress

  • fracture stress

  • silicon hinge

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