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  4. Crack tip localization of sub-critical crack growth by means of IR-imaging and pulse excitation
 
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2009
Conference Paper
Title

Crack tip localization of sub-critical crack growth by means of IR-imaging and pulse excitation

Abstract
Taking the advantage of the thermo-elastic effect, while using an infrared camera system, the mechanical stress could be made visible. The stress concentrations at the tip of a subcritical crack growth could clearly be detected. Through the observation during the periodic loading of a CT-specimen the crack growth rate can be determined. For this purpose, a specially developed loading stage will be presented. It is now possible to have further investigation in material class of polymers, which is very important in the field of system integration. First promising results will be presented.
Author(s)
May, D.
Wunderle, B.
Schacht, R.
Michel, B.
Mainwork
THERMINIC 2009, 15th International Workshop on Thermal Investigations of ICs and Systems  
Conference
International Workshop on Thermal Investigations of ICs and Systems (THERMINIC) 2009  
Language
English
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
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