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  4. Inline Tilt Measurements of Sintered Dies by Optical Line Scanning as Quality Assessment Tool for Smart Production
 
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2022
Conference Paper
Title

Inline Tilt Measurements of Sintered Dies by Optical Line Scanning as Quality Assessment Tool for Smart Production

Abstract
Tilt of semiconductor dies is a common issue during assembly in power electronics as, e.g. die bonding during silver sintering caused by inhomogeneous thicknesses of applied die-attach material, problems with a homogeneous force application, uneven substrates etc. This tilt usually leads to reliability problems later during testing or operation in the field. The reason behind this is a gradient in porosity in the die attach, where higher porosity regions will show considerably lower reliability under thermo-mechanical loading conditions. Unlike delamination and voids, excessive porosity and consequently resulting weakened bulk or interface regions can often be overlooked by SoA failure analytical techniques like scanning acoustic microscopy (SAM) or pulsed infrared thermography (PIRT), since acoustic impedance and thermal conductivity respectively are no adequate measure to resolve porosity changes in that interval. To enable products with enhanced reliability requirements such as power modules for future electric autonomous vehicles, tilt as a production tolerance in such assemblies must be reliably detected and inked for binning. Ideally this should be done on every component resulting in a 100% inspection. In addition to tilt, also the warpage of the chip provides valuable information about residual stresses and thus the quality of the joint and potential conspicuous behaviour in the field. Ideally, either of the two should be available within a 100% inline inspection paradigm, based on a novel testing hardware featuring rapid and accurate readout capabilities for immediate feedback into production as well as a connection to a big data environment for traceability within a smart production paradigm. We have developed a rugged, in-line capable and contactless optical tilt and BLT sensor for integration into an electronics manufacturing line under industrial boundary conditions. We furnish characteristic performance indicators exemplified on a production batch of sintered power dies.
Author(s)
May, D.
Technische Universität Chemnitz
Heilmann, J.
Technische Universität Chemnitz
Schulz, M.
Berliner Nanotest und Design GmbH
Boschman, E.
Boschman Advanced Packaging Technologies
Abo Ras, M.
Berliner Nanotest und Design GmbH
Wunderle, Bernhard  
Technische Universität Chemnitz  
Mainwork
23rd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE 2022)  
Project(s)
In-line quality inspection system for smart production of micro and nanoelectronic components  
Funding(s)
H2020  
Funder
European Commission  
Conference
International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems 2022  
DOI
10.1109/EuroSimE54907.2022.9758871
Language
English
Fraunhofer-Institut für Elektronische Nanosysteme ENAS  
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