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  4. Characterization of anodic bondable LTCC for wafer-level packaging
 
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2016
Conference Paper
Title

Characterization of anodic bondable LTCC for wafer-level packaging

Abstract
This work helps to clarify the effects on bondable Low Temperature Cofiered Cofired Ceramic(LTCC) material from Fraunhofer IKTS under different bonding conditions as changes in temperature, voltage and time. The Paper investigates silicon bonded to LTCC and silicon with a thin aluminum layer bonded to LTCC and compares both with anodic bonding of standard Borofloat 33® from Schott GmbH to silicon. The result of this work provides a comprehensive overview of bonding parameters for the materials Borofloat 33® and LTCC. An inspection of the bonding quality is carried out, which includes the optical inspection of the bonded area and interface observation via a scanning electron microscope (SEM). The bonding quality is also shown with the charge transfer during the bonding process. This paper can be used to achieve a higher degree of freedom in the design of hermetic wafer level packaging for various Micro-Electro-Mechanical System(MEMS)devices made of glass and ceramic materials.
Author(s)
Hu, Xiaodong
TU Berlin / MSG Lithoglas GmbH
Bäuscher, Manuel  
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
MacKowiak, Piotr
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
Zhang, Yucheng
TU Berlin
Hoelck, Ole
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
Walter, Hans  
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
Ihle, Martin  
Fraunhofer-Institut für Keramische Technologien und Systeme IKTS  
Ziesche, Steffen  
Fraunhofer-Institut für Keramische Technologien und Systeme IKTS  
Hansen, Ulli
MSG Lithoglas GmbH
Maus, Simon
MSG Lithoglas GmbH
Gyenge, Oliver
MSG Lithoglas GmbH
Mukhopadhyay, Biswajit  
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
Ehrmann, Oswin  
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
Lang, Klausdieter
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
Ngo, Haduong
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
Mainwork
IEEE 18th Electronics Packaging Technology Conference, EPTC 2016. Proceedings  
Conference
Electronics Packaging Technology Conference (EPTC) 2016  
DOI
10.1109/EPTC.2016.7861529
Language
English
Fraunhofer-Institut für Keramische Technologien und Systeme IKTS  
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
Keyword(s)
  • ceramic materials

  • characterization

  • charge transfer

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