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  4. Wafer-level glass capping with optical integration
 
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2010
Conference Paper
Title

Wafer-level glass capping with optical integration

Abstract
A previously described wafer-level packaging (WLP) process allows quasi-hermetic capping of optical devices on wafer level yielding miniaturized glass cavity windows on top of the optical area - at the same time leaving the contact area accessible for standard electrical connections i.e. wire bond. This paper will focus on advancements in integrating coatings, apertures and three-dimensional lensstructures to achieve a functional integration of a packaging technology with optical qualities. The elevated requirements on the used technologies are discussed and shown on a manufactured demonstrator.
Author(s)
Hansen, U.
Maus, S.
Leib, J.
Toepper, M.
Mainwork
Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS, DTIP 2010  
Conference
Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP) 2010  
Language
English
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
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