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  4. Silicon-CMOS compatible in-situ CCVD grown graphene transistors with ultra-high on/off-current ratio
 
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2012
Journal Article
Title

Silicon-CMOS compatible in-situ CCVD grown graphene transistors with ultra-high on/off-current ratio

Abstract
By means of catalytic chemical vapor deposition (CCVD) in-situ grown monolayer graphene field-effect transistors (MoLGFETs) and bilayer graphene transistors (BiLGFETs) are realized directly on oxidized silicon substrate without the need to transfer graphene layers. In-situ grown MoLGFETs exhibit the expected Dirac point together with the typical low on/off-current ratios. In contrast, BiLGFETs possess unipolar p-type device characteristics with an extremely high on/off-current ratio up to 1×10 7. The complete fabrication process is silicon CMOS compatible. This will allow a simple and low-cost integration of graphene devices for nanoelectronic applications in a hybrid silicon CMOS environment.
Author(s)
Wessely, P.J.
Wessely, F.
Birinci, E.
Beckmann, K.
Riedinger, B.
Schwalke, U.
Journal
Physica. E  
Project(s)
ELOGRAPH
Funder
Deutsche Forschungsgemeinschaft DFG  
Open Access
DOI
10.24406/publica-r-229074
10.1016/j.physe.2011.12.022
File(s)
001.pdf (683.29 KB)
Language
English
Fraunhofer-Institut für Werkstoffmechanik IWM  
Keyword(s)
  • graphene transistors

  • CCVD

  • bilayer graphene

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