• English
  • Deutsch
  • Log In
    Password Login
    Research Outputs
    Fundings & Projects
    Researchers
    Institutes
    Statistics
Repository logo
Fraunhofer-Gesellschaft
  1. Home
  2. Fraunhofer-Gesellschaft
  3. Konferenzschrift
  4. Evaluation of materials for high temperature IC packaging
 
  • Details
  • Full
Options
2010
Conference Paper
Title

Evaluation of materials for high temperature IC packaging

Abstract
Fast decrease of device dimensions, rapid growth of the number of elements per integrated circuit device (IC) and the increasing amount of interconnections between the chip and the substrate lead to a more complex design and production of the ICs and to higher demands towards packaging technology as well. This is especially true in the field of high temperature electronics with operating temperatures of up to 250°C. We present an evaluation of materials for both the adhesive and the encapsulant for packaging of high temperature ICs for this temperature range. Among the available materials only glassbased formulations could withstand extended periods of heat and substantial numbers of temperature cycles. In addition, samples of high temperature CMOS ICs (capacitive pressure sensors and EEPROMs) have been successfully assembled using these materials.
Author(s)
Klieber, R.
Fraunhofer-Institut für Mikroelektronische Schaltungen und Systeme IMS  
Lerch, R.G.
Fraunhofer-Institut für Mikroelektronische Schaltungen und Systeme IMS  
Mainwork
THERMINIC 2009, 15th International Workshop on Thermal Investigations of ICs and Systems  
Conference
International Workshop on Thermal Investigations of ICs and Systems (THERMINIC) 2009  
Language
English
Fraunhofer-Institut für Mikroelektronische Schaltungen und Systeme IMS  
Keyword(s)
  • Hochtemperatur

  • SOI-EEPROM

  • packaging

  • AVT

  • high temperature

  • Cookie settings
  • Imprint
  • Privacy policy
  • Api
  • Contact
© 2024