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Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM
Prepolymer film growth by adsorption out of solution on silicon and aluminium. An atomic force microscope study
XPS of the interphase between PMMA and metals. A study of degradation and interaction
XPS studies of thin polycyanurate films on silicon wafers
Organic film formation investigated by atomic force microscopy on the nanometer scale
Quantitative Erfassung von Oberflächentopographien
Klebtechnischen Gesetzmäßigkeiten auf der Spur
XPS studies of thin polycyanurate films on silicon wafers and aluminium substrates
Comparative film thickness determination by atomic force microscopy and ellipsometry for ultrathin prepolymer films
AFM investigations of the initial stages of prepolymer film growth on aluminium
Imaging elastic sample properties with an atomic force microscope operating in the Tapping Mode