XPS studies of thin polycyanurate films on silicon wafers and aluminium substrates
Abstract
The fundamental understanding of the chemical and physical phenomena of the adhesion at substrate/polymer interfaces is of great importance in order to be able to solve and control adhesion problems. We used a prepolymer of the diandicyante of bisphenol A (DCBA) as a model of a network polymer. The adsorption of thin DCBA-prepolymer films on silicon and aluminium substrates is studied by x-ray photoelectron spectroscopy (XPS), infrared spectrscopy (IR) and ellipsometry.
