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  4. Organic film formation investigated by atomic force microscopy on the nanometer scale
 
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1995
Journal Article
Title

Organic film formation investigated by atomic force microscopy on the nanometer scale

Other Title
Untersuchung der Bildung organischer Filme auf Nonometerskala mittels Rasterkraftmikroskopie
Author(s)
Gesang, T.
Höper, R.
Dieckhoff, S.
Schlett, V.
Possart, W.
Hennemann, O.-D.
Journal
Thin solid films  
DOI
10.1016/0040-6090(95)05846-X
Language
English
EPC  
Fraunhofer-Institut für Fertigungstechnik und Angewandte Materialforschung IFAM  
Keyword(s)
  • adsorption

  • AFM

  • aluminium coating

  • borderline angle

  • contact angle

  • coplanar

  • Copolymer

  • dip coating

  • film formation

  • Filmwachstum

  • Grenzlinienwinkel

  • Kontaktwinkel

  • prepolymer

  • silicon wafer

  • Silizium-Wafer

  • spin coating

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