https://publica.fraunhofer.de/entities/publication/e8822cd1-8e44-4921-9104-d52996643b40
https://publica.fraunhofer.de/entities/publication/e76a79a5-aaa7-4bd5-97d7-455e50150e2d
https://publica.fraunhofer.de/entities/publication/e6922dcf-dfa1-4b68-884d-ff1d3ac9e7b6
https://publica.fraunhofer.de/entities/publication/e7409998-020a-4e3d-afa8-2db3c83447a5
https://publica.fraunhofer.de/entities/publication/e772dd6a-a75c-47f2-a2ec-5cdd1d746446
https://publica.fraunhofer.de/entities/publication/e72ebcb9-a208-4620-a0ae-53e09003747c
https://publica.fraunhofer.de/entities/publication/e7548ef3-df9a-459d-8d72-ec08692b0ea0
https://publica.fraunhofer.de/entities/publication/e76b33d0-f095-4691-a73c-ad1c4680136c
https://publica.fraunhofer.de/entities/publication/e788b30b-7171-4114-bd17-d6dcb249fc75
https://publica.fraunhofer.de/entities/publication/e6be21c7-9f25-4a06-8191-fbd0f50a4e5c
https://publica.fraunhofer.de/entities/publication/e69d7437-d3d0-4511-bdd5-67b43075e0c3
https://publica.fraunhofer.de/entities/publication/e6b4dd03-0b05-44dc-8cb4-322fae42d7c9
https://publica.fraunhofer.de/entities/publication/e79eac0d-fbc1-492e-9c58-7ef04013a1bb
https://publica.fraunhofer.de/entities/publication/e69ce415-b8f4-44db-b58b-cebd3fac7eee
https://publica.fraunhofer.de/entities/publication/e6c31b37-777d-4a79-ab77-868d1effaee0
https://publica.fraunhofer.de/entities/publication/e6c80f53-1351-429a-99a4-f6935c6e8055
https://publica.fraunhofer.de/entities/publication/e79d8f83-d980-4f7f-8584-305f5c765f36
https://publica.fraunhofer.de/entities/publication/e693f4be-19d0-42de-bf83-90087b4bd7b6
https://publica.fraunhofer.de/entities/publication/e8005249-c0d5-40d1-b49c-606151418a91
https://publica.fraunhofer.de/entities/publication/e7aac463-c1d1-4bdf-b97a-b0fe20bc7fe9
https://publica.fraunhofer.de/entities/publication/e7e260e6-c3f7-437d-a325-9d29374450ab
https://publica.fraunhofer.de/entities/publication/e7f4c0e9-7519-4647-b229-fdb59e3b3de1
https://publica.fraunhofer.de/entities/publication/e3c2da95-20c0-4351-9a58-84d509e66ed1
https://publica.fraunhofer.de/entities/publication/e7eee41c-d21e-447d-a20e-eca88539da30
https://publica.fraunhofer.de/entities/publication/e7ef4403-f48f-40af-9e70-58467e17d720
https://publica.fraunhofer.de/entities/publication/e7dadce3-b7a2-4b66-9a07-93901c05d745
https://publica.fraunhofer.de/entities/publication/e7ddaa38-c029-4802-843f-8dbee921fb93
https://publica.fraunhofer.de/entities/publication/e4508880-3a58-4e0c-b6f3-da7f4e655a0e
https://publica.fraunhofer.de/entities/publication/ad12e845-a1fb-46f7-b3e3-89af2baa349c
https://publica.fraunhofer.de/entities/publication/e5a56375-2ccf-4046-af19-033839fda9ef
https://publica.fraunhofer.de/entities/publication/e68cb8d7-5bf8-4517-9592-fd85f7344f98
https://publica.fraunhofer.de/entities/publication/e62bd8f2-66f6-4598-b6f4-0aff38f37e7d
https://publica.fraunhofer.de/entities/publication/e5a5d232-0b7a-422f-9a22-f5963e9653c8
https://publica.fraunhofer.de/entities/publication/e671105f-e1ad-42a1-a2be-c62364373388
https://publica.fraunhofer.de/entities/publication/b58bb09c-743e-467d-bcc7-ffefdc0ba54f
https://publica.fraunhofer.de/entities/publication/ad2e16e9-ebca-4870-beda-270be0cb2ebb
https://publica.fraunhofer.de/entities/publication/b52de931-606b-4054-b7c9-e884e4658862
https://publica.fraunhofer.de/entities/publication/b55b3100-136b-4ebf-bdf1-1e5954bc61d2
https://publica.fraunhofer.de/entities/publication/b63df8cb-24f5-44c3-8fed-7a1cb46b721f
https://publica.fraunhofer.de/entities/publication/b6483e22-cc56-43ca-b141-dece28e55175
https://publica.fraunhofer.de/entities/publication/b63a880f-dded-48c9-9b04-08a0a65a6baf
https://publica.fraunhofer.de/entities/publication/b56039d4-cc0a-4aab-b6a6-49064bc9c747
https://publica.fraunhofer.de/entities/publication/b4ab8842-cecf-4961-aa01-6f478dbd7009
https://publica.fraunhofer.de/entities/publication/b673d665-7f4a-4598-9509-ee40b646da84
https://publica.fraunhofer.de/entities/publication/b4aed72e-f7d5-4109-9f1a-51f57cc859fc
https://publica.fraunhofer.de/entities/publication/b4bbef11-202c-44c3-8f96-20a93783df8d
https://publica.fraunhofer.de/entities/publication/b51a85a1-1459-4537-a554-4459e470907c
https://publica.fraunhofer.de/entities/publication/b45dc082-1e83-4ec8-9b06-3a7f9810b330
https://publica.fraunhofer.de/entities/publication/b48b8e75-1faa-409d-a533-f46eab37f5ae
https://publica.fraunhofer.de/entities/publication/b4c3d830-3ae0-4804-b0e7-c5f3dcd8c7b6
https://publica.fraunhofer.de/entities/publication/b4b23004-93b4-4337-9cf1-875c88d6994f
https://publica.fraunhofer.de/entities/publication/b458f9c5-9f4c-44fd-a2ff-06fee36c1df1
https://publica.fraunhofer.de/entities/publication/b45f8d9e-cf88-491a-b8a4-8e3b9a1e0c33
https://publica.fraunhofer.de/entities/publication/b458e533-f520-493f-8339-80d1401eb066
https://publica.fraunhofer.de/entities/publication/b69a8292-0f0b-46a3-a2ae-010a757438b4
https://publica.fraunhofer.de/entities/publication/b628f3e6-bae0-4efd-9185-51edc4845aaf
https://publica.fraunhofer.de/entities/publication/b61cbeb4-da63-4897-a63a-768384899cd9
https://publica.fraunhofer.de/entities/publication/b616863c-0fbe-4006-aceb-a039c75f8759
https://publica.fraunhofer.de/entities/publication/b51fa05d-ace0-40f4-a556-9cde63dfbc39
https://publica.fraunhofer.de/entities/publication/b601e31c-75c0-4860-b153-5246cdb29649
https://publica.fraunhofer.de/entities/publication/b5fba598-f479-4257-85d7-2a744fb0bb45
https://publica.fraunhofer.de/entities/publication/b6869c32-2e3c-48dd-8256-19be3d4d7ff6
https://publica.fraunhofer.de/entities/publication/b6836b60-2199-437e-bdb5-0ec2ae7d67b6
https://publica.fraunhofer.de/entities/publication/b5e9dc2f-efa9-4eef-80a5-0670ceb238b7
https://publica.fraunhofer.de/entities/publication/b5d5edae-03f9-48a8-aa2b-ce364d18add2
https://publica.fraunhofer.de/entities/publication/9523cb4e-2dd4-405a-a3ed-065e6ddd4444
https://publica.fraunhofer.de/entities/publication/b6297e77-232f-463f-8329-90df828eff92
https://publica.fraunhofer.de/entities/publication/952ab57e-9cf6-4101-a8cd-19810f0a8641
https://publica.fraunhofer.de/entities/publication/951ebe8d-c686-4dee-b182-fc0874f5c35a
https://publica.fraunhofer.de/entities/publication/9526c4aa-8c9c-4a20-9d5f-8c3172cc31c7
https://publica.fraunhofer.de/entities/publication/b5e05e22-ac7d-449e-ae45-548348eb403c
https://publica.fraunhofer.de/entities/publication/b632e224-c590-496f-9bbc-ca137cbc38f9
https://publica.fraunhofer.de/entities/publication/9a3a4f38-1b21-4dd0-b4f0-e7e637f6a0c8
https://publica.fraunhofer.de/entities/publication/95527295-15ee-4366-b501-bf656aba3c8b
https://publica.fraunhofer.de/entities/publication/9a2ed493-d5b0-4ea5-b468-6c2542b6a986
https://publica.fraunhofer.de/entities/publication/95db436f-16b6-498e-a930-5f18cb9a89fd
https://publica.fraunhofer.de/entities/publication/9a3c382b-263e-4bfd-84e9-2d6ce78c1337
https://publica.fraunhofer.de/entities/publication/9561be9b-8052-4b5b-9dbb-7aa68075bc7c
https://publica.fraunhofer.de/entities/publication/954b81cb-abab-493b-a0d7-99eec6b85001
https://publica.fraunhofer.de/entities/publication/95d51da7-fc5d-41f9-8684-87bec38882d8
https://publica.fraunhofer.de/entities/publication/95e03676-120f-448f-90a5-55f6a7338381
https://publica.fraunhofer.de/entities/publication/98f85838-d9f1-4a21-b6cf-84ace1ac2f01
https://publica.fraunhofer.de/entities/publication/990ba7d9-538a-45e9-9689-21b069e8af63
https://publica.fraunhofer.de/entities/publication/9942b765-8a19-4092-bf61-831171d26e63
https://publica.fraunhofer.de/entities/publication/9952f417-72a1-4d4a-9fe9-2984e24714cf
https://publica.fraunhofer.de/entities/publication/98fdb59f-cf61-44ce-b3a7-7889c86afbe4
https://publica.fraunhofer.de/entities/publication/9a3c6288-beb7-4400-a2dc-adf71916f0df
https://publica.fraunhofer.de/entities/publication/9955a259-1b55-4577-9289-2848c1ee09f0
https://publica.fraunhofer.de/entities/publication/98f9b45b-a42f-4f48-baff-2781b5b3a70e
https://publica.fraunhofer.de/entities/publication/9957ebee-3172-469a-9254-b688113c48ce
https://publica.fraunhofer.de/entities/publication/99707501-dcc7-4d30-8315-87bae318c6f8
https://publica.fraunhofer.de/entities/publication/9a990baf-dbae-4f5d-ac65-a3c45ff119b7
https://publica.fraunhofer.de/entities/publication/9960e3fd-10b7-4c91-828d-422ebc566fb4
https://publica.fraunhofer.de/entities/publication/995f49e7-9b3e-4163-a1ea-8dcd94ee1740
https://publica.fraunhofer.de/entities/publication/99788b7e-601b-407a-a8f3-2793c6f5c3fd
https://publica.fraunhofer.de/entities/publication/9a951ef7-1da8-43da-8427-4893143772bf
https://publica.fraunhofer.de/entities/publication/995b99cd-344d-4b1f-a476-ed275e9e6e2d
https://publica.fraunhofer.de/entities/publication/9a9e4eeb-7bbc-4d6c-9cc2-494936b0e434
https://publica.fraunhofer.de/entities/publication/9a907b3f-116b-4741-af58-bba8c0a5986a
https://publica.fraunhofer.de/entities/publication/998914a4-3558-4736-ab51-b71adf24b5fe
https://publica.fraunhofer.de/entities/publication/9988f085-d745-4cc8-97fa-84bde6b9df39
https://publica.fraunhofer.de/entities/publication/9a6a46f4-974e-4293-8580-d8f146c45c39
https://publica.fraunhofer.de/entities/publication/9986759d-30d7-4bc9-b6a2-db49d831fcc5
https://publica.fraunhofer.de/entities/publication/9a7d0fee-4710-4e07-9ae0-62e41c9707ab
https://publica.fraunhofer.de/entities/publication/9a78a315-df48-4fc5-9819-e0553435ec3f
https://publica.fraunhofer.de/entities/publication/9a5439ec-3d36-4039-8e50-50513cba5071
https://publica.fraunhofer.de/entities/publication/99e9c76c-c0bc-46e0-a93e-01acae11ca01
https://publica.fraunhofer.de/entities/publication/9aadb931-0691-4201-96a7-0158ab2e4ced
https://publica.fraunhofer.de/entities/publication/adc263fd-ab1c-455e-8975-59b33c288512
https://publica.fraunhofer.de/entities/publication/ada5ef58-af5b-4d06-9fb3-5c62b72992be
https://publica.fraunhofer.de/entities/publication/ae9b45a8-ab62-4f12-a19e-37687fe3a49d
https://publica.fraunhofer.de/entities/publication/99b6cff4-3fbc-49e2-a35a-7c2547daa9c8
https://publica.fraunhofer.de/entities/publication/ae94373b-a41e-4edb-85c7-93d4a18ba79f
https://publica.fraunhofer.de/entities/publication/99b5bc4d-b4c1-48a9-a515-9077f4d1d49d
https://publica.fraunhofer.de/entities/publication/99b43a56-7f74-4601-9a99-efec3110e11c
https://publica.fraunhofer.de/entities/publication/99ab12db-318f-4713-8218-823164cd15f2
https://publica.fraunhofer.de/entities/publication/ada9e957-2131-452f-8de1-67e5b307519f
https://publica.fraunhofer.de/entities/publication/af2160e1-461f-44b2-a9ac-967d5211fb15
https://publica.fraunhofer.de/entities/publication/aeb34652-302d-4cb0-ab52-e85e558ad000
https://publica.fraunhofer.de/entities/publication/aed0659d-ca75-495a-9ca8-80212ab2e3ed
https://publica.fraunhofer.de/entities/publication/af16b56f-069d-479b-982b-fa789eaf671e
https://publica.fraunhofer.de/entities/publication/aea541f2-58bf-4297-a38f-0ec2814d3fc4
https://publica.fraunhofer.de/entities/publication/af36a98f-eb63-4f91-9ee2-dcbca14c834e
https://publica.fraunhofer.de/entities/publication/af3bc8e5-b49f-4099-8d5b-cd2dbe0bbdb0
https://publica.fraunhofer.de/entities/publication/af239b8c-576b-4dc5-88a9-659df1ab62da
https://publica.fraunhofer.de/entities/publication/aeb7c236-38cc-4eda-b787-b11608f7431f
https://publica.fraunhofer.de/entities/publication/adf41af6-ec5a-4b97-b1f7-bfb35a6b587d
https://publica.fraunhofer.de/entities/publication/bacbd15c-ce33-45f6-bb99-7230c63747cc
https://publica.fraunhofer.de/entities/publication/b008a8ad-c809-4034-bd6b-1b309dd8ac8b
https://publica.fraunhofer.de/entities/publication/ae134484-c3cc-4ec6-9411-a917db6ae1d6
https://publica.fraunhofer.de/entities/publication/bab1e7e2-9ca2-40d7-a168-1be940de513f
https://publica.fraunhofer.de/entities/publication/bad05d9e-1e93-4eae-9f74-7e47323d42c5
https://publica.fraunhofer.de/entities/publication/baa2821b-5167-4921-a410-1518de23434c
https://publica.fraunhofer.de/entities/publication/bac46bd5-f8b4-49cd-90df-446140e94ae9
https://publica.fraunhofer.de/entities/publication/bab5281b-027d-4bc1-811e-e69b77b8b525
https://publica.fraunhofer.de/entities/publication/ba9e0d73-8fed-4a7f-9a21-56c39337e499
https://publica.fraunhofer.de/entities/publication/ba9cb4cb-4ade-4edb-a0b4-9ea7374361ad
https://publica.fraunhofer.de/entities/publication/bb648d88-987b-4e43-aa71-c748ae366be3
https://publica.fraunhofer.de/entities/publication/b1ed8d62-b811-4b0d-9356-8c75a67292c1
https://publica.fraunhofer.de/entities/publication/bb650270-1bf9-466f-a551-6ca8a1100fc1
https://publica.fraunhofer.de/entities/publication/bb66af30-4955-4266-81db-520622084d9d
https://publica.fraunhofer.de/entities/publication/bb55d585-defc-424d-a012-0bcd6b9e0664
https://publica.fraunhofer.de/entities/publication/bb43893d-2f00-409c-9ddc-cfc8467988f4
https://publica.fraunhofer.de/entities/publication/bb429f44-788f-4e64-bccf-b135e6a11215
https://publica.fraunhofer.de/entities/publication/bb51c17c-851f-4bd0-a319-567c70a4f9f7
https://publica.fraunhofer.de/entities/publication/ba889898-e3d9-4f7f-8381-efc261b0c9e0
https://publica.fraunhofer.de/entities/publication/b8ebf13d-bc26-4e9d-8417-b2dfc0aeb67d
https://publica.fraunhofer.de/entities/publication/b8c1b1d7-b34b-4def-a8e3-838399fd9c0a
https://publica.fraunhofer.de/entities/publication/b8466f0b-abd7-4295-b61a-9e173d7098ea
https://publica.fraunhofer.de/entities/publication/b83fabee-dbd6-405c-bdee-835e7b25bcec
https://publica.fraunhofer.de/entities/publication/b8efa59c-e4dd-4305-a251-0ce7cdaade86
https://publica.fraunhofer.de/entities/publication/b8fc4895-f4cf-4ee6-bed8-0ba3459323d6
https://publica.fraunhofer.de/entities/publication/b8449935-b5a5-474b-9f9c-40c11fd38691
https://publica.fraunhofer.de/entities/publication/b8f9b079-899c-45c7-9162-6698b8cdea2c
https://publica.fraunhofer.de/entities/publication/b8b2b56b-90f0-4c8d-8040-f9f6d06500b5
https://publica.fraunhofer.de/entities/publication/b28acade-8789-4b7c-8157-665b0d677e3c
https://publica.fraunhofer.de/entities/publication/b29fcb2c-1029-47ff-bef9-1cd3fd54f73f
https://publica.fraunhofer.de/entities/publication/b2da136a-00d0-4712-8052-73dafffd45ac
https://publica.fraunhofer.de/entities/publication/b2b2d216-244b-452a-af0f-bfc5cdb2c0a1
https://publica.fraunhofer.de/entities/publication/b2837e14-e5ef-453f-8a08-c6ed1d046756
https://publica.fraunhofer.de/entities/publication/b2cd00ed-e7f6-4d38-bc34-daec0b616a47
https://publica.fraunhofer.de/entities/publication/b29a04ed-dd22-4214-a7c9-00e6c6078c19
https://publica.fraunhofer.de/entities/publication/b28f3999-8375-4e94-92a0-27b29ba3f989
https://publica.fraunhofer.de/entities/publication/b2de90d5-eb43-482e-b5f4-c4e263579a8c
https://publica.fraunhofer.de/entities/publication/7a500026-6fce-46eb-88e1-e195ecb0836f
https://publica.fraunhofer.de/entities/publication/91f42a2b-4aee-4bac-b0a8-6ba799c67c64
https://publica.fraunhofer.de/entities/publication/77b50894-aab0-4087-896e-8884a61a83ea
https://publica.fraunhofer.de/entities/publication/777a92a0-696e-4679-b895-1b8bc29ad98e
https://publica.fraunhofer.de/entities/publication/78b96fcc-8af7-4fd3-b79b-6491294c5bd1
https://publica.fraunhofer.de/entities/publication/777c6d59-19e5-4ca8-acb4-a47a3c2478fa
https://publica.fraunhofer.de/entities/publication/77381a25-993d-4fc0-abe8-396b7627ae34
https://publica.fraunhofer.de/entities/publication/78b864cc-98b3-48a0-82ea-b4e1fa1ffdf1
https://publica.fraunhofer.de/entities/publication/777b60ae-6aaa-42dd-90ff-11a7b9a9953a
https://publica.fraunhofer.de/entities/publication/00f0e7c8-1c7d-47d9-8829-0de9f07f54ba
https://publica.fraunhofer.de/entities/publication/01ae5dc7-890e-4e16-80a4-30f71c905ec1
https://publica.fraunhofer.de/entities/publication/01d83988-32da-4dbd-912e-e449b8a570b3
https://publica.fraunhofer.de/entities/publication/01a7707f-3a6a-4f81-93b5-155afea6df9d
https://publica.fraunhofer.de/entities/publication/00f0f841-b716-47d8-91db-b2d9fe86f6b4
https://publica.fraunhofer.de/entities/publication/01fad77b-aebc-4572-9fcd-d40e2e264656
https://publica.fraunhofer.de/entities/publication/01ea1c50-c1d7-4fbe-ac41-c499eb94ee46
https://publica.fraunhofer.de/entities/publication/00e2935b-de3f-45c6-8f3d-8142d4c781f1
https://publica.fraunhofer.de/entities/publication/00f25d03-9018-4f2a-82c3-1e5a9d68d1aa
https://publica.fraunhofer.de/entities/publication/d2757c5c-9881-4159-8f51-aea590fe9b72
https://publica.fraunhofer.de/entities/publication/d23df508-441e-4838-9f53-3708ca7150a1
https://publica.fraunhofer.de/entities/publication/d24bf2ac-2082-4a01-8a98-dc447866ef7d
https://publica.fraunhofer.de/entities/publication/d61cf1c9-926d-492f-bb5d-ac3bc1205e61
https://publica.fraunhofer.de/entities/publication/d268ed13-df7b-472a-aa9b-106f2e4e60e9
https://publica.fraunhofer.de/entities/publication/d2323044-7c1c-4954-b64d-1f9f9a2c657b
https://publica.fraunhofer.de/entities/publication/d2605792-6667-4241-8697-6a6142799a94
https://publica.fraunhofer.de/entities/publication/d24149fc-d4cd-4f69-b596-051f437b8708
https://publica.fraunhofer.de/entities/publication/e3a1bf03-dd67-4870-8bd8-a7df83464758
https://publica.fraunhofer.de/entities/publication/e39dd722-1afb-4865-be84-0b9e3c212c0e
https://publica.fraunhofer.de/entities/publication/e3b1e3b8-a67f-4d23-a885-9f34b3dd6618
https://publica.fraunhofer.de/entities/publication/e38e54d1-a6bb-4e1a-8079-d3f4c4ddb725
https://publica.fraunhofer.de/entities/publication/e3ade2cc-99df-4886-9c2a-afd026db89b3
https://publica.fraunhofer.de/entities/publication/e38e5028-8018-45ec-8cf3-5be076124570
https://publica.fraunhofer.de/entities/publication/e395cf7e-f032-4d83-85c0-eb6a33b41fa9
https://publica.fraunhofer.de/entities/publication/e3ae4e4d-ba78-4b60-a592-3635c8467c12
https://publica.fraunhofer.de/entities/publication/e3aa7f70-edbd-4219-85b4-03a87534a787
https://publica.fraunhofer.de/entities/publication/e06e3218-4baa-4875-8418-84e88593f035
https://publica.fraunhofer.de/entities/publication/e0fab3fb-5f89-46e7-bced-10b4d34312d3
https://publica.fraunhofer.de/entities/publication/e05b45d6-2a7b-40dd-879c-e694f22e0223
https://publica.fraunhofer.de/entities/publication/e0863a24-356f-4e3e-ba4c-1640c687bb76
https://publica.fraunhofer.de/entities/publication/e0fa44c2-e196-4f72-87bc-edf89c499e69
https://publica.fraunhofer.de/entities/publication/e07ba210-123c-4356-a839-f1b854568468
https://publica.fraunhofer.de/entities/publication/e069b98d-498d-4055-b253-20bca5817989
https://publica.fraunhofer.de/entities/publication/e08390df-262a-4234-8910-ef5cebf80fda
https://publica.fraunhofer.de/entities/publication/e08a2c14-5d7c-4bec-a8fc-b04400776717
https://publica.fraunhofer.de/entities/publication/d1cca3fc-6aae-4525-93be-879766d01cac
https://publica.fraunhofer.de/entities/publication/d1d604bc-1632-4bf1-a733-b62e676dd6c0
https://publica.fraunhofer.de/entities/publication/94091566-9f5e-43dc-9897-4522ff2efefe
https://publica.fraunhofer.de/entities/publication/940ba369-0aef-4243-a7b6-007162c095b5
https://publica.fraunhofer.de/entities/publication/ff8c3e33-7c1b-4028-acb5-33c68a242f77
https://publica.fraunhofer.de/entities/publication/d1d68438-d898-429b-a253-2921ceb72c55
https://publica.fraunhofer.de/entities/publication/d1e0db61-c92f-4045-b23c-77202119aa29
https://publica.fraunhofer.de/entities/publication/d1e6e810-1158-4a00-a510-44276d1cc945
https://publica.fraunhofer.de/entities/publication/ff7e08b1-255f-47ea-959c-c0d3e418b49f
https://publica.fraunhofer.de/entities/publication/aef24dd3-928c-455a-88cd-97a099abb567
https://publica.fraunhofer.de/entities/publication/adddeddb-3441-461f-bfb3-4f5f95c2e2ca
https://publica.fraunhofer.de/entities/publication/acf92699-e9c6-41fc-b120-970b00764aec
https://publica.fraunhofer.de/entities/publication/af3d4ff3-0807-4e72-bf96-3610636ae233
https://publica.fraunhofer.de/entities/publication/acc40f1b-6d20-4477-8a43-bbdc65192507
https://publica.fraunhofer.de/entities/publication/b1dc2917-c277-4c1c-bf3b-0b49474a33df
https://publica.fraunhofer.de/entities/publication/b0ece773-9ae4-4fc3-8ca6-59eba33dc33c
https://publica.fraunhofer.de/entities/publication/b1ec7c6a-738c-42c2-bbd4-9837cf8c4ab6
https://publica.fraunhofer.de/entities/publication/ace93c32-da6a-4b5e-a088-96648e2d61e5
https://publica.fraunhofer.de/entities/publication/b0fc0ae7-213e-4bfc-bb8e-1320a298cb21
https://publica.fraunhofer.de/entities/publication/bc1f4649-5e76-4d86-87cc-b29712dc4ee9
https://publica.fraunhofer.de/entities/publication/bc4ba983-ec99-4dbb-9713-e11cd345eef2
https://publica.fraunhofer.de/entities/publication/bc43ee7c-1e5b-4afd-aa10-ae2329f80943
https://publica.fraunhofer.de/entities/publication/bc3ea0b1-562f-4b64-9163-4c5ed4d0e0df
https://publica.fraunhofer.de/entities/publication/bc19e514-2813-4273-b6c0-12d0dc207ef6
https://publica.fraunhofer.de/entities/publication/bc26bdc4-81f4-4d5d-86d9-b698e5d309f9
https://publica.fraunhofer.de/entities/publication/bbf7db2a-ef26-4297-ab88-c83054b18ede
https://publica.fraunhofer.de/entities/publication/bc228449-f9ba-40a0-8fd2-1aa07d3c57b4
https://publica.fraunhofer.de/entities/publication/bc270fa2-56c4-48da-848d-1c374a23e078
https://publica.fraunhofer.de/entities/publication/b34490bf-027b-4cb7-8139-4f46444cab91
https://publica.fraunhofer.de/entities/publication/b8329869-ff6d-4b2a-bb21-2c3e8559aeb6
https://publica.fraunhofer.de/entities/publication/b3c6bd65-83b3-4240-a459-997645624524
https://publica.fraunhofer.de/entities/publication/b74c6868-91af-49ec-b5ad-e2e1ca031ebb
https://publica.fraunhofer.de/entities/publication/b52266f7-8fde-4319-9e29-390ce5a7c890
https://publica.fraunhofer.de/entities/publication/b43aaefd-483e-40b1-bdd7-67fcb774d651
https://publica.fraunhofer.de/entities/publication/b4043a97-c4ec-43f8-9d63-05f992519c6a
https://publica.fraunhofer.de/entities/publication/b410de0c-d0e8-4558-a608-bde836b9c368
https://publica.fraunhofer.de/entities/publication/b74d7a04-199d-4a4c-afd8-eed028b4e880
https://publica.fraunhofer.de/entities/publication/a26f9f2f-9245-4fe5-bb9d-3be60cf0244b
https://publica.fraunhofer.de/entities/publication/a24f36b8-bc84-485d-8ce1-9c6acd975215
https://publica.fraunhofer.de/entities/publication/a24b9eb6-25e9-4c19-9b6f-1075f0eb3675
https://publica.fraunhofer.de/entities/publication/a1de8b6b-dbd9-4e98-abc2-ee5ab5f6d40b
https://publica.fraunhofer.de/entities/publication/a1ee2b3e-ba08-4f2a-9d7b-bd2448d22145
https://publica.fraunhofer.de/entities/publication/a26fc576-bd31-493a-8863-6fb7c2e6a90f
https://publica.fraunhofer.de/entities/publication/a26e54de-a284-43c9-a7cd-9057f37b4e00
https://publica.fraunhofer.de/entities/publication/a237a711-7f8c-43c9-a0af-91e98dfd826a
https://publica.fraunhofer.de/entities/publication/a25e57cd-9fe5-4ecb-8108-98ef560c0831
https://publica.fraunhofer.de/entities/publication/05d33bab-99fb-4397-8f46-7d7e6438709a
https://publica.fraunhofer.de/entities/publication/05e03677-a0bb-48da-8ba9-003a4e7d3b02