2003
Conference Proceeding
Title

Advanced characterization techniques for optics, semiconductors, and nanotechnologies

Title Supplement
3 - 5 August 2003, San Diego, California, USA
Person Involved
Duparre, A.
Singh, B.
Corporate Author
Society of Photo-Optical Instrumentation Engineers -SPIE-, Bellingham/Wash.
Publisher
Publishing Place
Bellingham, WA
Conference
Language
English