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  4. High-fidelity single-electron shuttling in industrially fabricated spin qubit devices
 
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2025
Conference Paper
Title

High-fidelity single-electron shuttling in industrially fabricated spin qubit devices

Abstract
We have fabricated single-electron shuttling channels in Si/SiGe heterostructures within an industrial 200 mm production line as building block for a scalable quantum computing architecture with spin qubits. Shuttling is achieved via an adiabatically moved quantum dot which is formed by a series of only four individual, sinusoidal voltage signals, applied to a dense grid of gate electrodes, enhancing scalability. The gate module comprises a triple metal gate process, where one gate layer uses electron-beam lithography to achieve a pitch below 100 nm in the complex grid architecture. With the device presented in this study, we have been able to achieve an electron shuttling success rate higher than 99.9 % across a distance of 4.5 μm.
Author(s)
Muster, Pascal
Infineon Technologies AG
Langheinrich, Wolfram
Infineon Technologies AG
Huckemann, Till
Rheinisch-Westfälische Technische Hochschule Aachen
Pregl, Sebastian
Infineon Technologies AG
Brackmann, Varvara
Fraunhofer-Institut für Photonische Mikrosysteme IPMS  
Friedrich, Michael
Fraunhofer-Institut für Photonische Mikrosysteme IPMS  
Reichmann, Felix
Institut fur innovative Mikroelektronik (IHP)
Komericki, Nikola
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Schreiber, Lars R.
Rheinisch-Westfälische Technische Hochschule Aachen
Bluhm, Hendrik
Rheinisch-Westfälische Technische Hochschule Aachen
Mainwork
IEEE International Electron Devices Meeting, IEDM 2025  
Project(s)
Halbleiter-Quantenprozessor mit shuttlingbasierter skalierbarer Architektur  
Quantum Large Scale Integretion in Silicon  
Initiative for european Semiconductor-based Large-scale Quantum computer  
Funder
Bundesministerium für Bildung und Forschung  
European Commission  
European Commission  
Conference
International Electron Devices Meeting 2025  
DOI
10.1109/IEDM50572.2025.11353490
Language
English
Fraunhofer-Institut für Photonische Mikrosysteme IPMS  
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
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