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  4. High-performance EUV Ptychography at 13.5 nm
 
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2023
Conference Paper
Title

High-performance EUV Ptychography at 13.5 nm

Abstract
We present table-top high-speed EUV ptychography at 13.5 nm. Employing a novel sCMOS detector enables 5x faster wide-field imaging with an imaging speed of 4.6 Mpix/h. Further, Hertz-scale high-resolution EUV wavefront sensing is demonstrated.
Author(s)
Eschen, Wilhelm
Helmholtz Institute Jena
Liu, Cheng
Helmholtz Institute Jena
Penagos Molina, Daniel S.
Helmholtz Institute Jena
Klas, Robert
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF  
Limpert, Jens  
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF  
Rothhardt, Jan  
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF  
Mainwork
Computational Optical Sensing and Imaging  
Conference
Meeting "Computational Optical Sensing and Imaging" 2023  
Imaging and Applied Optics Congress 2023  
DOI
10.1364/COSI.2023.CM4B.6
Language
English
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF  
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