Case Study of a Miscorrelation Between CDM Testing and CC-TLP Characterization of Multi-GHz RF Pins

A peak current failure threshold miscorrelation was observed between CDM (~8.4A) testing and capacitively coupled (CC)-TLP (>11.5A) characterization of multi-GHz RF pins. Both field induced CDM and CC-TLP test methods also revealed a different failure mechanism and signature. The failure threshold of the multi-GHz RF pins appeared to be ultra-fast rise time (Tr~50ps) dependent.