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  4. Characterization of a 5 GHz Frequency Divider for a Cryogenic PLL in 22-nm FDSOI
 
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November 17, 2025
Conference Paper
Title

Characterization of a 5 GHz Frequency Divider for a Cryogenic PLL in 22-nm FDSOI

Abstract
This work presents a low-power, fully characterized cryogenic CMOS frequency divider (FD) with divide ratio 512 at 5 GHz, implemented in 22 nm FDSOI for quantum control. Forward back-gate biasing enables robust 4 K operation without a cryo-specific PDK. The divider achieves 1.08 ps RMS jitter and –145.5 dBc/Hz phase noise at 100 kHz offset while consuming 450 µW for the core and 800 µW for the buffer at 4 K. Measurements across temperature and bias points reveal body-bias impact on jitter and noise, guiding cryo-CMOS optimization. Compared to prior work, this design offers higher divide ratio, wider temperature range, and compatibility with standard CMOS. Integration within a cryogenic Phase Locked Loop (PLL) confirms system-level functionality and suitability for scalable, energy-efficient quantum systems.
Author(s)
Bhattacharyya, Himadri Shekhar
Fraunhofer-Einrichtung für Mikrosysteme und Festkörper-Technologien EMFT  
Weber, Johannes
Fraunhofer-Einrichtung für Mikrosysteme und Festkörper-Technologien EMFT  
Isa, Erkan Nevzat  
Fraunhofer-Einrichtung für Mikrosysteme und Festkörper-Technologien EMFT  
Böhme, Enno
Fraunhofer-Institut für Elektronische Mikrosysteme und Festkörper-Technologien EMFT  
Borggreve, David  
Fraunhofer-Einrichtung für Mikrosysteme und Festkörper-Technologien EMFT  
Hagelauer, Amelie  
Fraunhofer-Einrichtung für Mikrosysteme und Festkörper-Technologien EMFT  
Mainwork
32nd IEEE International Conference on Electronics, Circuits and Systems (ICECS) 2025  
Conference
International Conference on Electronics, Circuits and Systems 2025  
DOI
10.1109/ICECS66544.2025.11270511
Language
English
Fraunhofer-Institut für Elektronische Mikrosysteme und Festkörper-Technologien EMFT  
Keyword(s)
  • Phase noise

  • Phase locked loops

  • Standards

  • Cryo-CMOS

  • Frequency divider

  • 22nm FDSOI

  • Back-gate biasing

  • Phase noise

  • Master–slave D Flip-Flop (DFF)

  • Quantum computing

  • Quantum system

  • Silicon-on-insulator

  • Cryogenics

  • Jitter

  • Frequency conversion

  • Main-secondary

  • Threshold voltage

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