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  4. A Fast Reading Method for Multi-Level RRAM in Small-Scale Arrays
 
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November 17, 2025
Conference Paper
Title

A Fast Reading Method for Multi-Level RRAM in Small-Scale Arrays

Abstract
Resistive Random-Access Memory (RRAM) has gained significant interest due to its promising features such as scalability, non-volatility, and multi-level storage capability. This work presents a high-speed reading method employing three parallel Strong-Arm latch comparators operating within a single clock cycle. The proposed approach uses resistor-based reference net and all resistance levels of the one-transistor one-resistor (1T1R) RRAM can be read within 6ns, with a total read power consumption of 61.3µW. The design is well-suited for small-scale RRAM arrays and crossbar architectures, offering a fast and low-power solution.
Author(s)
Guo, Running
Fraunhofer-Einrichtung für Mikrosysteme und Festkörper-Technologien EMFT  
Liu, Keyu
Fraunhofer-Einrichtung für Mikrosysteme und Festkörper-Technologien EMFT  
Pechmann, Stefan
Fraunhofer-Einrichtung für Mikrosysteme und Festkörper-Technologien EMFT  
Hagelauer, Amelie  
Fraunhofer-Einrichtung für Mikrosysteme und Festkörper-Technologien EMFT  
Mainwork
32nd IEEE International Conference on Electronics, Circuits and Systems (ICECS) 2025  
Conference
International Conference on Electronics, Circuits and Systems 2025  
DOI
10.1109/ICECS66544.2025.11270665
Language
English
Fraunhofer-Institut für Elektronische Mikrosysteme und Festkörper-Technologien EMFT  
Keyword(s)
  • Resistance

  • Latches

  • Resistors

  • Power demand

  • Scalability

  • Microprocessors

  • Computer architecture

  • Robustness

  • Voltage control

  • Clocks

  • RRAM

  • reading circuit

  • 1T1R

  • reference resistor

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