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  4. Coincidence measurement of two-photon double ionization of argon through an autoionizing resonance
 
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2025
Journal Article
Title

Coincidence measurement of two-photon double ionization of argon through an autoionizing resonance

Abstract
We present coincidence measurements of two-photon double ionization (TPDI) of argon driven by femtosecond pulses tunable around 26.5eV photon energy, which are obtained from a high-harmonic generation source. The measured photoelectron spectra are interpreted with regard to three TPDI mechanisms. Theoretical predictions are obtained by an approximate model for direct TPDI and atomic structure calculations, which are implemented into a Monte Carlo simulation. The prevailing mechanism involves the excitation and prompt photoionization of an autoionizing resonance in neutral argon. We provide evidence for pronounced electron-electron interaction in this ultrafast ionization process. Furthermore, we show that the dominant TPDI mechanism can be altered by slight tuning of the photon energy. The present work paves the way for scrutinizing and controlling nonlinear photoionization in the extreme ultraviolet using table-top sources.
Author(s)
Hell, Sebastian
Friedrich-Schiller-Universität Jena
Späthe, Julian
Friedrich-Schiller-Universität Jena
Førre, Morten
Universitetet i Bergen
Klas, Robert
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF  
Rothhardt, Jan  
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF  
Limpert, Jens  
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF  
Moshammer, Robert
Max-Planck-Institut für Kernphysik
Ott, Christian
Max-Planck-Institut für Kernphysik
Paulus, Gerhard G.
Friedrich-Schiller-Universität Jena
Fritzsche, Stephan
Helmholtz Institute Jena
Kübel, Matthias
Friedrich-Schiller-Universität Jena
Journal
Physical review research  
Open Access
File(s)
Download (699.35 KB)
Rights
CC BY 4.0: Creative Commons Attribution
DOI
10.1103/f63d-4hrh
10.24406/publica-6752
Additional link
Full text
Language
English
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF  
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