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  4. Growth of wurtzite ferroelectrics
 
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2025
Review
Title

Growth of wurtzite ferroelectrics

Abstract
Thin films with wurtzite crystal structure feature some of the best compatibility with the major semiconductor platforms among ferroelectrics, as well as high remanent polarization, excellent stability, and scalability; making them very attractive for microelectronics applications ranging from memories to sensors and actuators. Their intrinsic functionality, which enables these applications directly links device performance to the underlying growth processes. This article gives an overview of the three main deposition methods for the material class (sputtering, molecular beam epitaxy, metal–organic chemical vapor deposition), their individual advantages as well as how they can contribute to solving the main challenges that remain to be overcome in order to bring wurtzite ferroelectrics to large-scale applications. Furthermore, it differentiates the growth of wurtzite ferroelectrics from that of more established thin-film ferroelectrics.
Author(s)
Fichtner, Simon  
Fraunhofer-Institut für Siliziumtechnologie ISIT  
Uehara, Masato
National Institute of Advanced Industrial Science and Technology
Streicher, Isabel
Istituto Per La Microelettronica E Microsistemi, Catania
Yang, Samuel
Michigan Engineering
Maria, Jon Paul
Pennsylvania State University
Mi, Zetian
Michigan Engineering
Funakubo, Hiroshi
Institute of Science Tokyo
Leone, Stefano  
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Journal
MRS Bulletin  
Open Access
File(s)
Download (5.12 MB)
Rights
CC BY 4.0: Creative Commons Attribution
DOI
10.1557/s43577-025-00997-6
10.24406/publica-5834
Additional link
Full text
Language
English
Fraunhofer-Institut für Siliziumtechnologie ISIT  
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Keyword(s)
  • Ferroelectric

  • Memory

  • Nitride

  • Thin film

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