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  4. AI-Enhanced and Automated Indirect Process Monitoring at the Sensor Edge
 
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2025
Conference Paper
Title

AI-Enhanced and Automated Indirect Process Monitoring at the Sensor Edge

Abstract
This work presents a novel concept of the edgebased indirect measurement framework designed for real-time process automation, leveraging inverse problem-solving methodologies and AI-driven inference. We discuss the potential of this approach in sample applications such as automated clothing segregation using near-infrared (NIR) sensors and measurement of sugar concentration in water using capacitive micromachined ultrasonic transducers (CMUTs). The paper highlights the role of stochastic computing implemented on FPGAs to enhance efficiency and enable low-latency processing directly at the sensor edge. We provide an in-depth analysis of why stochastic computing and inverse neural operators are promising for future real-time AI/ML hardware acceleration in indirect measurement applications. Future work will focus on practical implementation and validation of these concepts through FPGA-based inference models.
Author(s)
Nobari, Maedeh
Fraunhofer-Institut für Photonische Mikrosysteme IPMS  
Jablonski, Ireneusz
Fraunhofer-Institut für Photonische Mikrosysteme IPMS  
Mainwork
48th International Spring Seminar on Electronics Technology, ISSE 2025  
Conference
International Spring Seminar on Electronics Technology 2025  
DOI
10.1109/ISSE65583.2025.11121054
Language
English
Fraunhofer-Institut für Photonische Mikrosysteme IPMS  
Keyword(s)
  • Artificial Intelligence

  • Edge Sensor

  • Indirect Measurement

  • Inverse Problem

  • Process Automation

  • Stochastic Computing

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