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  4. Temperature Sensing Readout Circuits with 4H-SiC Technology
 
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December 16, 2024
Conference Paper
Title

Temperature Sensing Readout Circuits with 4H-SiC Technology

Abstract
4H-Silicon Carbide (4H-SiC) technology is well known for its superior thermal conductivity, high-temperature stability, and robustness in harsh environments. This paper presents three distinct temperature-sensing readout circuits (a PMOS array, an NMOS array, and a CMOS-based ring os-cilia tor) utilizing this technology. The readout circuits with PMOS and NMOS arrays are showing Proportional to Absolute Temperature (PTAT) behavior. For a temperature range of 25-200 ° C, these designs are showing a sensitivity of 26.8 mV/ ° C (PMOS array) and 19.60 mV/° C (NMOS array), respectively, at a VDD of 20 V. At the same power supply voltage a 7-stage CMOS ring oscillator-based sensor which gives the digital output, is showing a sensitivity of 44.01 kHz °C and a power consumption of 2.14 m W. These readout circuits find potential applications in implementing on-chip temperature sensing systems.
Author(s)
Khan, Md Asif
Bahubalindruni, Pydi Ganga
May, Alexander  
Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie IISB  
Rossi, Chiara  orcid-logo
Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie IISB  
Rommel, Mathias  orcid-logo
Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie IISB  
Mainwork
10th IEEE International Symposium on Smart Electronic Systems, iSES 2024. Proceedings  
Conference
International Symposium on Smart Electronic Systems 2024  
DOI
10.1109/iSES63344.2024.00023
Language
English
Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie IISB  
Keyword(s)
  • Mobility

  • PMOS and NMOS Array

  • Ring Oscillator

  • Sensitivity

  • Temperature

  • Thresold Voltage

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