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  4. Investigation of a Single-Gate GaN HEMT as Bidirectional Switch in a Low Voltage Multilevel Topology
 
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2025
Conference Paper
Title

Investigation of a Single-Gate GaN HEMT as Bidirectional Switch in a Low Voltage Multilevel Topology

Abstract
This work utilizes one conventional AlGaN/GaN HEMT with one gate as bidirectional switch in a three-level T-type converter topology operating at up to 48 V. The focus of this work is the investigation of the limits of AlGaN/GaN HEMTs in this operational region. An experimental setup with a Z-diode based driving circuit verifies the bidirectional switching capabilities of conventional single-gate AlGaN/GaN HEMTs and shows that their absence of the intrinsic body diode can be considered as an additional degree of freedom and not as a drawback.
Author(s)
Grieshaber, Daniel  orcid-logo
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Reiner, Richard  
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Basler, Michael  
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Benkhelifa, Fouad  
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Quay, Rüdiger  orcid-logo
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Mönch, Stefan  orcid-logo
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Mainwork
PCIM Europe 2025, International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management  
Conference
International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management 2025  
Language
English
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
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