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  4. The influence of sputter-deposited indium tin oxide thin films on the strength of ultra-thin glass
 
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March 1, 2025
Journal Article
Title

The influence of sputter-deposited indium tin oxide thin films on the strength of ultra-thin glass

Abstract
Ultra-thin glass with a thickness of 100μm or below is an attractive substrate for sputter deposition of thin films. However, research has shown that the deposition of functional coatings is often correlated with a significant strength reduction of the underlying glass.
This study aims to identify relevant thin film properties that influence the ultra-thin glass strength using the example of indium tin oxide. For that, thin films with varying properties were sputter-deposited on ultra-thin glass. Then, correlations between glass strength and surface roughness, film morphology, and thin film stress were analyzed.
It could be shown that the thin film stress and the film morphology are of major importance regarding the strength of the coated ultra-thin glass. In contrast, the surface roughness is expected to be of minor importance. Different models of the interaction between thin film and existing flaws in the glass are suggested to explain the experimental data.
Author(s)
Langgemach, Wiebke
Fraunhofer-Institut für Elektronenstrahl- und Plasmatechnik FEP  
Fahland, Matthias  
Fraunhofer-Institut für Elektronenstrahl- und Plasmatechnik FEP  
Rädlein, Edda
Technische Universität Ilmenau
Journal
Open ceramics  
Open Access
DOI
10.1016/j.oceram.2024.100710
Additional full text version
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Language
English
Fraunhofer-Institut für Elektronenstrahl- und Plasmatechnik FEP  
Keyword(s)
  • Ultra-thin glass

  • Strength testing

  • Indium tin oxide

  • Ball-on-ring test

  • Transparent conductive oxide

  • Thin film stress

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