Compensation Techniques for Bandwidth-Distorted Measurements of Fast Transients in Double Pulse Tests

While assessing the losses in Wide-Bandgap (WBG) devices in a Double-Pulse-Test (DPT), stringent requirements for high-fidelity probes have to be applied. The limited bandwidth of a probe has a significant influence on the measurement results due to its inherent delay and distortion effects that originate from its parasitic or discrete filter components. This paper proposes a technique to compensate for these influences by post-processing measured data based on the characteristics of the used probes. Instead of using a complex inverse transfer function of the probe, an average error compensation is developed and discussed for use in a DPT and validated based on circuit simulation.