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  4. A reliability study on automated defect assessment in optical pulsed thermography
 
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2023
Journal Article
Title

A reliability study on automated defect assessment in optical pulsed thermography

Abstract
Nowadays, the reliability of data analysis and decision-making based on deep learning (DL) remains a primary concern in promoting DL technology for industrial non-destructive testing and evaluation (NDT&E). This study focuses on the quantitative assessment of the reliability of various automated data analysis techniques in NDT&E.
To achieve this, optical pulsed thermography was employed to inspect three non-planar carbon-fiber-reinforced polymer (CFRP) samples, each containing embedded Teflon to simulate debonding defects. After applying thermographic signal reconstruction and first-order derivation processing to the raw thermal data, automated analysis was performed using three image-processing-based segmentation methods and three sequential-signal based DL algorithms. Additionally, an experienced inspector manually analyzed the data for comparison pur poses. Subsequently, the probability of detection and false positive analyses were conducted to quantitatively evaluate and compare the reliability of the automated and human-based evaluations. The comparison results demonstrated that optimal DL classification and advanced image-processing-based segmentation techniques could achieve performance levels close to that of human inspectors in defect detection, even for challenging non planar CFRP samples.
Author(s)
Xiang, Siyu
School of Physics and Electronics, Central South University
Omer, Akam M.
School of Physics and Electronics, Central South University
Li, Mingjun
School of Physics and Electronics, Central South University
Yang, Dazhi
School of Electrical Engineering and Automation, Harbin Institute of Technology
Osman, Ahmad  
Fraunhofer-Institut für Zerstörungsfreie Prüfverfahren IZFP  
Han, Bingyang
Gao, Zhenze
School of Physics and Electronics, Central South University
Hu, Hongbo
School of Physics and Electronics, Central South University
Ibarra-Castanedo, Clemente
Computer Vision and Systems Laboratory (CVSL), Department of Electrical and Computer Engineering, Laval University
Maldague, Xavier
Computer Vision and Systems Laboratory (CVSL), Department of Electrical and Computer Engineering, Laval University
Fang, Qiang
Computer Vision and Systems Laboratory (CVSL), Department of Electrical and Computer Engineering, Laval University
Sfarra, Stefano
Department of Industrial and Information Engineering and Economics, University of L'Aquila
Zhang, Hai
Centre for Composite Materials and Structures, Harbin Institute of Technology
Duan, Yuxia
School of Physics and Electronics, Central South University
Journal
Infrared physics and technology  
DOI
10.1016/j.infrared.2023.104878
Language
English
Fraunhofer-Institut für Zerstörungsfreie Prüfverfahren IZFP  
Keyword(s)
  • Deep learning

  • Pulsed thermography

  • Reliability

  • Probability of detection

  • Segmentation

  • Automated evaluation

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