• English
  • Deutsch
  • Log In
    Password Login
    Research Outputs
    Fundings & Projects
    Researchers
    Institutes
    Statistics
Repository logo
Fraunhofer-Gesellschaft
  1. Home
  2. Fraunhofer-Gesellschaft
  3. Konferenzschrift
  4. Multiwavelength Holography: Absolute Height Measurements Ready for Application in Gear Metrology
 
  • Details
  • Full
Options
2023
Conference Paper
Title

Multiwavelength Holography: Absolute Height Measurements Ready for Application in Gear Metrology

Abstract
So far, it has been almost impossible to determine axial distance between two holographic measurements without overlap. We present gear measurements detecting the absolute tip-position in the sensor coordinate system better than 3.5 µm.
Author(s)
Schiller, Annelie  
Fraunhofer-Institut für Physikalische Messtechnik IPM  
Fratz, Markus  
Fraunhofer-Institut für Physikalische Messtechnik IPM  
Seyler, Tobias  
Fraunhofer-Institut für Physikalische Messtechnik IPM  
Bertz, Alexander  
Fraunhofer-Institut für Physikalische Messtechnik IPM  
Carl, Daniel  
Fraunhofer-Institut für Physikalische Messtechnik IPM  
Mainwork
Digital Holography and Three-Dimensional Imaging 2023  
Conference
Optica Imaging Congress 2023  
Imaging and Applied Optics Congress 2023  
Meeting "Digital Holography and Three-Dimensional Imaging" 2023  
Language
English
Fraunhofer-Institut für Physikalische Messtechnik IPM  
Keyword(s)
  • Multiwavelength holography

  • Height measurement

  • Gear metrology

  • Cookie settings
  • Imprint
  • Privacy policy
  • Api
  • Contact
© 2024