Wideband Cross-Domain Characterization of a W-band Amplifier MMIC

In this paper, we present a novel on-chip multi-tone characterization of a millimeter-wave amplifier MMIC in a waveguide environment covering W-band frequencies. The measurement setup comprises extension modules in WR-10, where a new architecture with a wideband RF input enables source calibration. The setup is capable of measuring small-signal parameters while the same configuration is able to excite wideband multi-tone or complex modulated signals and measure the signal response for a time-domain analysis. The in-situ combination of an analog millimeter-wave frequency domain setup with digitally modulated wideband time domain entities is described as a cross-domain measurement setup. A W-band power amplifier chip is used as a device-under-test, where a multi-tone test is conducted and the response of complex modulated signals is analyzed.