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October 19, 2023
Conference Paper
Title

In-orbit VNIR sensor quality validation

Abstract
The Institute of Optical Sensor Systems (OS) at the Robotics and Mechatronics Center of the German Aerospace Center (DLR) has more than 40 years of experience in high-resolution imaging and imaging technology. This paper presents the current status of the institute’s work on next-generation CMOS-TDI detector development. Together with the partners IHP (Leibniz Institute for High Performance Microelectronics), IMS (Fraunhofer Institute for Microelectronic Circuits and Systems), and JOP (Jena-Optronik GmbH), a new test detector was designed consisting of an embedded charge-coupled device (eCCD) and a readout integrated circuit (ROIC), combined as a silicon-bonded design. This approach enables operation at a line rate up to 150 kHz and a full well capacity above 150 ke-, thus making it very promising for high-spatial-resolution imaging systems. An FPGA-based engineering model environment with high design flexibility distributes all eCCD clocking and ROIC control signals. The unidirectional eCCD design is optimized for electrical charge injection tests and is used to verify in-orbit initialization approaches, including eCCD signal reconstruction. The paper will outline this procedure. Due to the accessible detector building blocks, this setup is ideally suited for future evaluation and verification of accumulative radiation effects on the eCCD and ROIC structures and determining possible corrective actions to contain overall radiation-related performance degradation over the mission lifetime. The evaluated method is intended to estimate the sensor’s behavior under space environmental conditions during the entire mission by introducing a detector initialization phase.
Author(s)
Buschek, Johannes
Deutsches Zentrum für Luft- und Raumfahrt e.V. -DLR-  
Eckardt, Andreas
Deutsches Zentrum für Luft- und Raumfahrt e.V. -DLR-  
Manthey, Kristian
Deutsches Zentrum für Luft- und Raumfahrt e.V. -DLR-  
Sengebusch, Karsten
EURECA Messtechnik GmbH
Schrey, Olaf  
Fraunhofer-Institut für Mikroelektronische Schaltungen und Systeme IMS  
Piechaczek, Denis Szymon
Fraunhofer-Institut für Mikroelektronische Schaltungen und Systeme IMS  
Kahmen, Gerhard
Leibniz-Institut für innovative Mikroelektronik (IHP)
Mainwork
Sensors, Systems, and Next-Generation Satellites XXVII  
Conference
Conference "Sensors, Systems, and Next-Generation Satellites" 2023  
DOI
10.1117/12.2680166
Language
English
Fraunhofer-Institut für Mikroelektronische Schaltungen und Systeme IMS  
Keyword(s)
  • charge coupled device (CCD)

  • CMOS (complementary metal oxide semiconductor)

  • TDI (time delay integration)

  • charge injection

  • signal reconstruction

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