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  4. A New Approach to In-Situ Formtest-Interferometry
 
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2003
Conference Paper
Title

A New Approach to In-Situ Formtest-Interferometry

Abstract
Interferometry is a common method for testing the form of ultra-precise components. However interferometrical measurements are very sensitive to
external influences. Due to this reason, in-situ measurements are very difficult to perform, especially in the vicinity of production processes. In this paper we present a new concept for the integration of interferometers in a machine tool and first results of the analysis of fundamental influences on interferometers operated in-situ.
Author(s)
Doerner, Dirk
Fraunhofer-Institut für Produktionstechnologie IPT  
Bai, Alexander
Fraunhofer-Institut für Produktionstechnologie IPT  
Mangalasseril, P.
Fraunhofer-Institut für Produktionstechnologie IPT  
Pfeifer, Tilo
Fraunhofer-Institut für Produktionstechnologie IPT  
Mainwork
Metrology in the 3rd millennium  
Project(s)
Prozessketten zur Replikation komplexer Optikkomponenten
Funder
Deutsche Forschungsgemeinschaft -DFG-, Bonn  
Conference
IMEKO World Congress 2003  
Link
Link
Language
English
Fraunhofer-Institut für Produktionstechnologie IPT  
Keyword(s)
  • Interferometry

  • In-situ measurement

  • Simulation

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