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  4. Uniformity Analysis of Metallization-Induced Recombination Losses by Photoluminescence Imaging
 
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2022
Conference Paper
Title

Uniformity Analysis of Metallization-Induced Recombination Losses by Photoluminescence Imaging

Abstract
We present an approach for the determination of the locally averaged recombination parameter j0,met assigned to the metal contacts of a solar cell. A set of samples with test fields combined with an interpolation scheme allows the precise prediction of expected local photoluminescence imaging (PLi) intensities for virtually non-metallized sample areas with a standard deviation of 0.7%. The ratio of the actually measured PLi signal in a metallized test field with respect to the predicted signal of the virtually non-metallized test field then serves as an input for numerical simulations for the extraction of j0,met. We find a clear correlation of the locally determined j0,met with both, the local peak firing temperature measured in-situ by a thermal imaging system installed in the firing furnace and the local sheet resistance of the diffused n+-region. These results demonstrate the high capability and accuracy of our approach for the uniformity characterization of metallization-induced recombination losses.
Author(s)
Wolf, Andreas  
Fraunhofer-Institut für Solare Energiesysteme ISE  
Herrmann, David
Fraunhofer-Institut für Solare Energiesysteme ISE
Falconi, David
Fraunhofer-Institut für Solare Energiesysteme ISE
Ourinson, Daniel
Fraunhofer-Institut für Solare Energiesysteme ISE  
Brand, Andreas  
Fraunhofer-Institut für Solare Energiesysteme ISE  
Lohmüller, Sabrina  
Fraunhofer-Institut für Solare Energiesysteme ISE  
Höffler, Hannes  
Fraunhofer-Institut für Solare Energiesysteme ISE  
Fell, Andreas  
Fraunhofer-Institut für Solare Energiesysteme ISE  
Mainwork
SiliconPV 2021, 11th International Conference on Crystalline Silicon Photovoltaics  
Conference
International Conference on Crystalline Silicon Photovoltaics (SiliconPV) 2021  
DOI
10.1063/5.0089268
Language
English
Fraunhofer-Institut für Solare Energiesysteme ISE  
Keyword(s)
  • Metallization process

  • Electric measurements

  • Photoluminescence

  • Infrared imaging

  • Interpolation

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