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  4. Analytical model of free charge transfer in charge-coupled devices
 
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2023
Journal Article
Title

Analytical model of free charge transfer in charge-coupled devices

Abstract
A one-dimensional analytical model of charge transfer in charge-coupled devices, which describes the spatial-temporal behavior of the charge carrier density in a potential well, is presented. The general solution of this model considers the transfer dynamics in terms of the electric drift field, i.e., self-induced drift and fringing-field drift, and yields an analytical solution for the total number of charge carriers. A comparison of the transfer efficiency for various electric drift fields is presented. The modulation transfer function in dependence on the transfer efficiency is analyzed, aiming especially at time-delay integration (TDI) applications. Finally, the results of this model are concluded and discussed in detail.
Author(s)
Piechaczek, Denis Szymon
Fraunhofer-Institut für Mikroelektronische Schaltungen und Systeme IMS  
Hosticka, Bedrich J.
Fraunhofer-Institut für Mikroelektronische Schaltungen und Systeme IMS  
Ligges, Manuel  
Fraunhofer-Institut für Mikroelektronische Schaltungen und Systeme IMS  
Schrey, Olaf  
Fraunhofer-Institut für Mikroelektronische Schaltungen und Systeme IMS  
Kokozinski, Rainer  
Fraunhofer-Institut für Mikroelektronische Schaltungen und Systeme IMS  
Journal
Solid-State Electronics  
DOI
10.1016/j.sse.2022.108513
Language
English
Fraunhofer-Institut für Mikroelektronische Schaltungen und Systeme IMS  
Keyword(s)
  • charge coupled device

  • self-induced drift

  • fringing-field drift

  • electric drift field

  • transfer efficiency

  • charge transfer

  • modulation transfer function

  • time-delay integration

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