MIMO Design of 12x64 Element Polarization Sensitive SiGe Array for 3D In-line Detection of Defects at 220-260 GHz

Non-destructive testing of glass fiber-reinforced composites in mass production requires suitable in-line testing methods that allow single part inspection for quality assurance. We show a design for a MIMO array whose high number of elements can accelerate the measurement process and enables inline capable 3D imaging systems. The MIMO array achieves a lateral resolution of 1mm and provides for the first time a polarization selective arrangement to better detect defects as deviations in the periodic structures of composite materials. Furthermore, the design of the high frequency PCBs for the installation of the SiGe receivers is shown as a first step on the way to a 3D imaging system.