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  4. Hard x-ray wavefront engineering for aberration correction and beam shaping
 
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2022
Conference Paper
Title

Hard x-ray wavefront engineering for aberration correction and beam shaping

Abstract
While modern X-ray microscopes at synchrotron radiation sources and free-electron lasers require X-ray optics of highest quality, these optics often show aberrations due to limitations in fabrication technology. Based on ptychography, we determine these aberrations and fabricate tailor made refractive phase plates to compensate for them. Starting from the aberrated optics, di raction-limited beams can be generated by introducing the phase plate behind these optics. In addition, the wavefront can be modi ed to generate custom beams for special needs, such as donut-shaped beams with orbital angular momentum or for structured-illumination microscopy. The nanofocused beam can be engineered in shape and phase by introducing specially designed phase plates. We introduce a general scheme for wavefront engineering and illustrate it with a numerical example.
Author(s)
Schroer, Christian G.
Deutsches Elektronen-Synchrotron -DESY-, Hamburg  
Seiboth, Frank
Deutsches Elektronen-Synchrotron -DESY-, Hamburg  
Schropp, Andreas
Deutsches Elektronen-Synchrotron -DESY-, Hamburg  
Achilles, Silvio
Deutsches Elektronen-Synchrotron -DESY-, Hamburg  
Seyrich, Martin
Deutsches Elektronen-Synchrotron -DESY-, Hamburg  
Patjens, Svenja
Deutsches Elektronen-Synchrotron -DESY-, Hamburg  
Stuckelberger, Michael E.
Deutsches Elektronen-Synchrotron -DESY-, Hamburg  
Garrevoet, Jan
Deutsches Elektronen-Synchrotron -DESY-, Hamburg  
Galbierz, Vanessa
Deutsches Elektronen-Synchrotron -DESY-, Hamburg  
Falkenberg, Gerald
Deutsches Elektronen-Synchrotron -DESY-, Hamburg  
Kubec, Adam
Paul Scherrer Institut -PSI-  
David, Christian
Paul Scherrer Institut -PSI-  
Niese, Sven
AXO DRESDEN
Gawlitza, Peter  
Fraunhofer-Institut für Werkstoff- und Strahltechnik IWS  
Mainwork
Advances in X-Ray/EUV Optics and Components XVII  
Conference
Conference "Advances in X-Ray/EUV Optics and Components" 2022  
Open Access
DOI
10.1117/12.2633458
Language
English
Fraunhofer-Institut für Werkstoff- und Strahltechnik IWS  
Keyword(s)
  • X-ray optics

  • ptychography

  • aberration correction

  • diffraction-limited focusing

  • beam shaping

  • wave-front engineering

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