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  4. High-resolution 3D shape measurement with extended depth of field using fast chromatic focus stacking
 
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2022
Journal Article
Titel

High-resolution 3D shape measurement with extended depth of field using fast chromatic focus stacking

Abstract
Close-range 3D sensors based on the structured light principle have a constrained measuring range due to their depth of field (DOF). Focus stacking is a method to extend the DOF. The additional time to change the focus is a drawback in high-speed measurements. In our research, the method of chromatic focus stacking was applied to a high-speed 3D sensor with 180 fps frame rate. The extended DOF was evaluated by the distance-dependent 3D resolution derived from the 3D-MTF of a tilted edge. The conventional DOF of 14 mm was extended to 21 mm by stacking two foci at 455 and 520 nm wavelength. The 3D sensor allowed shape measurements with extended DOF within 44 ms.
Author(s)
Ramm, Roland
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF
Mozaffari-Afshar, M.
Docter Optics SE
Höhne, Daniel
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF
Hilbert, Thomas
Docter Optics SE
Speck, Henri
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF
Kühl, Siemen
Docter Optics SE
Hoffmann, Daniela
Docter Optics SE
Erbes, Sebastian
Docter Optics SE
Kühmstedt, Peter
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF
Heist, Stefan
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF
Notni, Gunther
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF
Zeitschrift
Optics Express
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DOI
10.1364/OE.454856
Language
English
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