2021
Conference Paper
Title

Nano-CT imaging of electrically stressed power device metallization

Abstract
In this paper, we show that nano-CT imaging can provide detailed information on the degradation that occurs in power device metallization during a fast PTC stress. Nano-CT imaging provides a high resolution, 3D imaging method to understand degradation mechanisms in packaged power semiconductor devices.
Author(s)
Mueller, D.
Fella, C.
Altmann, F.
Graetz, J.
Balles, A.
Ring, M.
Gambino, J.
Mainwork
Conference
DOI
Language
English