• English
  • Deutsch
  • Log In
    or
  • Research Outputs
  • Projects
  • Researchers
  • Institutes
  • Statistics
Repository logo
Fraunhofer-Gesellschaft
  1. Home
  2. Fraunhofer-Gesellschaft
  3. Konferenzschrift
  4. Imaging acquisition and mapping for fast directional reflectance measurements
 
  • Details
  • Full
Options
2020
Conference Paper
Titel

Imaging acquisition and mapping for fast directional reflectance measurements

Abstract
We present an alternative measurement method for BRDF characterization. It is based on imaging instead of angular sampling. Under illumination, the reflectance characteristic of the analyzed material is projected onto a hemispheric diffuse reflective dome surrounding the probe. Images of the dome are taken to capture the directional distribution of the reflected light. This shows the main advantage of the new method: The simultaneous capture of the reflectance within a hemispherical sector, therefore accelerating greatly the data acquisition. However, some additional processing steps have to be implemented to achieve results comparable to the sampling method. Captures with different integration times have to be merged into a high dynamic range (HDR) image and a pixel mapping to absolute scattering angles in spherical coordinates (elevation and azimuth) has to be registered. Measurements acquired with this first simple approach are quantitatively compared to the aforemen tioned established sampling acquisition method for two different materials: A diffuse lambertian reference and a higher gloss degree material. These results are discussed in the last section and will serve as guidelines for future iteration developments of the proposed method.
Author(s)
López Martínez, Marcos
Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung IOSB
Hartmann, Tim
Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung IOSB
Kremer, Michael
Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung IOSB
Hauptwerk
Target and Background Signatures VI
Konferenz
Conference "Target and Background Signatures" 2020
Thumbnail Image
DOI
10.1117/12.2573495
Language
English
google-scholar
Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung IOSB
  • Cookie settings
  • Imprint
  • Privacy policy
  • Api
  • Send Feedback
© 2022