• English
  • Deutsch
  • Log In
    Password Login
    or
  • Research Outputs
  • Projects
  • Researchers
  • Institutes
  • Statistics
Repository logo
Fraunhofer-Gesellschaft
  1. Home
  2. Fraunhofer-Gesellschaft
  3. Konferenzschrift
  4. Determining Elastic Constants of AlScN Films on Silicon Substrates by Laser Ultrasonics
 
  • Details
  • Full
Options
2020
Conference Paper
Titel

Determining Elastic Constants of AlScN Films on Silicon Substrates by Laser Ultrasonics

Abstract
Laser ultrasound was used to determine dispersion curves of surface acoustic waves on a Si (001) surface covered by AlScN films with a scandium content between 0 and 41%. By including off-symmetry directions for wavevectors, all five independent elastic constants of the film were extracted from the measurements. Results for their dependence on the Sc content are presented and compared to corresponding data in the literature, obtained by alternative experimental methods or by ab-initio calculations.
Author(s)
Rogall, Olga
Offenburg University of Applied Sciences
Feil, Niclas M.
INATECH
Ding, Anli
Fraunhofer-Institut für Angewandte Festkörperphysik IAF
Mayer, Elena
Offenburg University of Applied Sciences
Pupyrev, Pavel D.
Prokhorov General Physics Institute of the Russian Academy of Sciences
Lomonosov, Alexey M.
Prokhorov General Physics Institute of the Russian Academy of Sciences
Zukauskaite, Agne
Fraunhofer-Institut für Angewandte Festkörperphysik IAF
Ambacher, Oliver
Fraunhofer-Institut für Angewandte Festkörperphysik IAF
Mayer, Andreas P.
Offenburg University of Applied Sciences
Hauptwerk
IEEE International Ultrasonics Symposium, IUS 2020. Symposium Proceedings
Konferenz
International Ultrasonics Symposium (IUS) 2020
Thumbnail Image
DOI
10.1109/IUS46767.2020.9251632
Language
English
google-scholar
Fraunhofer-Institut für Angewandte Festkörperphysik IAF
Tags
  • laser ultrasound

  • aluminium scandium ni...

  • surface acoustic wave...

  • Cookie settings
  • Imprint
  • Privacy policy
  • Api
  • Send Feedback
© 2022