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  4. Determining Elastic Constants of AlScN Films on Silicon Substrates by Laser Ultrasonics
 
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2020
Conference Paper
Title

Determining Elastic Constants of AlScN Films on Silicon Substrates by Laser Ultrasonics

Abstract
Laser ultrasound was used to determine dispersion curves of surface acoustic waves on a Si (001) surface covered by AlScN films with a scandium content between 0 and 41%. By including off-symmetry directions for wavevectors, all five independent elastic constants of the film were extracted from the measurements. Results for their dependence on the Sc content are presented and compared to corresponding data in the literature, obtained by alternative experimental methods or by ab-initio calculations.
Author(s)
Rogall, Olga
Offenburg University of Applied Sciences
Feil, Niclas M.
INATECH
Ding, Anli  
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Mayer, Elena
Offenburg University of Applied Sciences
Pupyrev, Pavel D.
Prokhorov General Physics Institute of the Russian Academy of Sciences
Lomonosov, Alexey M.
Prokhorov General Physics Institute of the Russian Academy of Sciences
Zukauskaite, Agne  
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Ambacher, Oliver  
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Mayer, Andreas P.
Offenburg University of Applied Sciences
Mainwork
IEEE International Ultrasonics Symposium, IUS 2020. Symposium Proceedings  
Conference
International Ultrasonics Symposium (IUS) 2020  
DOI
10.1109/IUS46767.2020.9251632
Language
English
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Keyword(s)
  • laser ultrasound

  • aluminium scandium nitride

  • surface acoustic waves

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