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  4. A GaN-based currrent sense amplifier for GaN HEMTs with integrated current shunts
 
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2020
Conference Paper
Titel

A GaN-based currrent sense amplifier for GaN HEMTs with integrated current shunts

Abstract
This work shows a GaN-based current sense amplifier as a read out circuit for a power GaN HEMT with integrated current shunt. In the GaN power transistor, the voltage drop of the outermost metal finger of a large-area comb structure effectively realizes a shunt acting as a current sensor. This small voltage drop of the integrated shunt (approx. 4 mV/A at 100 mOon-resistance) is amplified by a two-stage GaN-based amplifie rwith a gain of >40 dB at room temperature. The amplifier consisting of two series-connected differential amplifiers with source follower intermediate stages was verified in a double pulse test setup up to a peak current of 11.5 A. Consequently, the proposed current sense amplifier allows a simple and potentially integratable further processing for the monitoring or control ofthe current signal.
Author(s)
Basler, Michael
Fraunhofer-Institut für Angewandte Festkörperphysik IAF
Mönch, Stefan orcid-logo
Fraunhofer-Institut für Angewandte Festkörperphysik IAF
Reiner, Richard
Fraunhofer-Institut für Angewandte Festkörperphysik IAF
Waltereit, Patrick
Fraunhofer-Institut für Angewandte Festkörperphysik IAF
Quay, Rüdiger orcid-logo
Fraunhofer-Institut für Angewandte Festkörperphysik IAF
Kallfass, Ingmar
Institute of Robust Power Semiconductor Systems
Ambacher, Oliver
Fraunhofer-Institut für Angewandte Festkörperphysik IAF
Hauptwerk
32nd International Symposium on Power Semiconductor Devices and ICs, ISPSD 2020. Proceedings
Konferenz
International Symposium on Power Semiconductor Devices and ICs (ISPSD) 2020
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DOI
10.1109/ISPSD46842.2020.9170047
Language
English
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Fraunhofer-Institut für Angewandte Festkörperphysik IAF
Tags
  • gallium nitride

  • HEMTs

  • current measurement

  • sensors

  • logic circuits

  • amplifier

  • power integrated circ...

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