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  4. How to improve throughput in direct laser interference patterning: Top-hat beam profile and burst mode
 
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2020
Conference Paper
Title

How to improve throughput in direct laser interference patterning: Top-hat beam profile and burst mode

Abstract
This study describes the implementation of a top-hat pulsed laser for high-throughput structuring using Direct Laser Interference Patterning (DLIP). Using two and four laser beams, dot and line-like periodic surface structures were produced, respectively. The top-hat laser profile allows treating the surface of the target materials without the need to overlap the different laser pulses and thus being capable of reducing the processing time compared to Gaussian energy distributions. Similarly, using a burst of pulses, the ablation efficiency of the DLIP process could be significantly improved. Finally, ablation tests on stainless steel samples are presented and discussed.
Author(s)
Voisiat, Bogdan
TU Dresden
Ströbel, Joachim
TU Dresden
Du, Keming
EdgeWave
Lasagni, Andrés-Fabián  
Fraunhofer-Institut für Werkstoff- und Strahltechnik IWS  
Mainwork
Laser-based Micro- and Nanoprocessing XIV  
Funder
Bundesministerium für Wirtschaft und Energie BMWi (Deutschland)  
Conference
Conference "Laser-Based Micro- and Nanoprocessing" 2020  
DOI
10.1117/12.2547271
Language
English
Fraunhofer-Institut für Werkstoff- und Strahltechnik IWS  
Keyword(s)
  • laser application

  • profiling

  • laser sources

  • beam shaping

  • diffractive optical elements

  • laser ablation

  • pulsed laser operation

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