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  4. Quantum dot location relevance into SET-FET circuits based on FinFET devices
 
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2018
Conference Paper
Title

Quantum dot location relevance into SET-FET circuits based on FinFET devices

Other Title
Relevanz der Position des Quantenpunkts für auf FinFET-Bauelementen basierenden SET-FET-Schaltungen
Abstract
Hybrid SET-FET circuits are candidates to extend the SET usefulness for low power circuits and with high integration density. The location of quantum dot (QD) of the SET is usually expected at the centre of the tunneling barrier, but out this ideality the QD may not be precisely located. For this, to analyse the impact of the QD location variation will be of high interest to predict the hybrid circuit behaviour.
Author(s)
Amat, Esteve
Institute of Microelectronics of Barcelona (IMB-CNM, CSIC)
Moral, Alberto del
Institute of Microelectronics of Barcelona (IMB-CNM, CSIC)
Bausells, Joan
Institute of Microelectronics of Barcelona (IMB-CNM, CSIC)
Perez-Murano, Francesc
Institute of Microelectronics of Barcelona (IMB-CNM, CSIC)
Klüpfel, Fabian
Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie IISB  
Mainwork
XXXIII Conference on Design of Circuits and Integrated Systems, DCIS 2018. Proceedings  
Project(s)
IONS4SET  
Funder
European Commission EC  
Conference
Conference on Design of Circuits and Integrated Systems (DCIS) 2018  
DOI
10.1109/DCIS.2018.8681478
Language
English
Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie IISB  
Keyword(s)
  • single-electron transistor

  • Quantum Dot

  • FinFET

  • variability

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