• English
  • Deutsch
  • Log In
    Password Login
    Research Outputs
    Fundings & Projects
    Researchers
    Institutes
    Statistics
Repository logo
Fraunhofer-Gesellschaft
  1. Home
  2. Fraunhofer-Gesellschaft
  3. Konferenzschrift
  4. Secondary Discharge during System Level ESD Tests
 
  • Details
  • Full
Options
2019
Conference Paper
Title

Secondary Discharge during System Level ESD Tests

Abstract
By means of two examples, this work describes the influence of secondary discharge events during system level ESD testing on the failure threshold and the failure behavior of the involved electronic circuits. The first system is a kind of remote control, which did not pass the qualification by showing an increased current consumption. The second example is an automotive keyless entry controller, which failed in the field by entering a sleep mode after facing a discharge event. In both cases it was necessary to measure in-situ the discharge current in order to analyze the behavior in more detail.
Author(s)
Wolf, Heinrich  
Fraunhofer-Einrichtung für Mikrosysteme und Festkörper-Technologien EMFT  
Weber, Johannes  
Fraunhofer-Einrichtung für Mikrosysteme und Festkörper-Technologien EMFT  
Gieser, Horst  
Fraunhofer-Einrichtung für Mikrosysteme und Festkörper-Technologien EMFT  
Mainwork
16. ESD-Forum 2019. Tagungsband  
Conference
ESD-Forum 2019  
Language
English
Fraunhofer-Einrichtung für Mikrosysteme und Festkörper-Technologien EMFT  
Keyword(s)
  • ESD

  • secondary discharge

  • system level ESD

  • current sensor

  • Cookie settings
  • Imprint
  • Privacy policy
  • Api
  • Contact
© 2024