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2019
Poster
Title
SiC MOSFET with a self-aligned channel defined by shallow source-JFET implantation: A simulation study
Title Supplement
Poster presented at International Conference on Silicon Carbide & Related Materials, September 29th - October 04th, 2019, Kyoto, Japan
Abstract
Large cell density within power device is needed to obtain low on state resistance. Cell integration is limited by resolution and overlay accuracy of photolithography. Self-aligned processes, e.g. the self-aligned channel for SiC MOSFET using an over-oxidized polysilicon implantation mask, help to downsale the cell pitch and to increase the cell integration in the device.