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  4. Further investigation on laser-induced damage thresholds of camera sensors and micro-optomechanical systems
 
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2019
Conference Paper
Titel

Further investigation on laser-induced damage thresholds of camera sensors and micro-optomechanical systems

Abstract
Based on our previous work1, we further investigate the laser-induced damage effects on digital micromirror devices (DMD) in comparison to different electro-optical imaging sensors such as complementary metal-oxide-semiconductors (CMOS) and charge-coupled devices (CCD). In our earlier work, we reported on damage thresholds obtained by pulsed laser radiation of nanosecond pulse width and by continuous-wave laser radiation utilizing irradiation times ranging from 250 milliseconds up to 10 seconds. The main objective of our current work is to fill the gap regarding the time scale of picosecond pulses. In the course of this research, we enhanced the experimental setup and we explicitly describe the achieved improvements in this work. Furthermore, we characterize the damage caused by laser pulse energies exceeding the laser-induced damage threshold (LIDT).
Author(s)
Schwarz, Bastian
Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung IOSB
Körber, Michael
Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung IOSB
Ritt, Gunnar
Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung IOSB
Eberle, Bernd
Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung IOSB
Hauptwerk
Technologies for Optical Countermeasures XVI
Konferenz
Conference "Technologies for Optical Countermeasures" 2019
Thumbnail Image
DOI
10.1117/12.2533142
Language
English
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Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung IOSB
Tags
  • laser-induced damage ...

  • charge-coupled device...

  • complementary metal-o...

  • digital micromirror d...

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