HMX crystal topography investigated by means of atomic force microscopy and confocal microscopy

The surface morphology of HMX grades (euhedral and subhedral) was investigated by means of atomic force microscopy and confocal microscopy. The crystals revealed quite different topographic structures, including step-shaped surfaces, outgrowths from the crystal bulk, fine particles intergrown to the bulk, surface roughness and in case of a type B grade HMX a highly defective surface layer. Stochastic methods were applied to quantify surface parameters such as the density and mean height of outgrowths/particles and the mean depth of the porous surface layer.