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2019
  • Vortrag

Titel

Fundamentals for IoT Testing

Titel Supplements
Presentation held at Congreso Internacional Cibersociedad 2019, 14 y el 18 de octubre de 2019, Varadero
Abstract
In IoT, quality engineering faces new challenges. For example, the system under test (SUT) vary from single IoT devices to highly dynamic IoT infrastructures and platforms. Consequently, test design techniques have to be able to deal with a high number of devices with open interfaces. Those devices are sensors, actuators, microcontrollers or gateways. Sometimes they are installed in harsh and unreliable environments. Primarily, devices like sensors and microcontrollers work under resource constrained conditions such as energy supply or network availability. Functional and non-functional aspects play an important role and need to be considered.
Author(s)
Hackel, Sascha
Fraunhofer-Institut für Offene Kommunikationssysteme FOKUS
Rennoch, Axel
Fraunhofer-Institut für Offene Kommunikationssysteme FOKUS
Funder
Bundesministerium für Wirtschaft und Energie BMWi (Deutschland)
Konferenz
Congreso Internacional Cibersociedad (CS) 2019
File(s)
N-561838.pdf (2.23 MB)
Language
Englisch
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FOKUS
Tags
  • test automation

  • IoT

  • TTCN-3

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