• English
  • Deutsch
  • Log In
    Password Login
    Research Outputs
    Fundings & Projects
    Researchers
    Institutes
    Statistics
Repository logo
Fraunhofer-Gesellschaft
  1. Home
  2. Fraunhofer-Gesellschaft
  3. Konferenzschrift
  4. Generation of adversarial examples to prevent misclassification of deep neural network based condition monitoring systems for cyber-physical production systems
 
  • Details
  • Full
Options
2018
Conference Paper
Title

Generation of adversarial examples to prevent misclassification of deep neural network based condition monitoring systems for cyber-physical production systems

Abstract
Deep neural network based condition monitoring systems are used to detect system failures of cyber-physical production systems. However, a vulnerability of deep neural networks are adversarial examples. They are manipulated inputs, e.g. process data, with the ability to mislead a deep neural network into misclassification. Adversarial example attacks can manipulate the physical production process of a cyber-physical production system without being recognized by the condition monitoring system. Manipulation of the physical process poses a serious threat for production systems and employees. This paper introduces CyberProtect, a novel approach to prevent misclassification caused by adversarial example attacks. CyberProtect generates adversarial examples and uses them to retrain deep neural networks. This results in a hardened deep neural network with a significant reduced misclassification rate. The proposed countermeasure increases the classification rate from 20% to 82%, as proved by empirical results.
Author(s)
Specht, Felix  
Otto, Jens  
Niggemann, Oliver
Hammer, Barbara
Mainwork
IEEE 16th International Conference on Industrial Informatics, INDIN 2018. Proceedings  
Conference
International Conference on Industrial Informatics (INDIN) 2018  
Open Access
File(s)
Download (1.17 MB)
Rights
Use according to copyright law
DOI
10.1109/INDIN.2018.8472060
10.24406/publica-r-402945
Language
English
Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung IOSB  
  • Cookie settings
  • Imprint
  • Privacy policy
  • Api
  • Contact
© 2024